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Electrical properties of the CdTe back contact: A new chemically etching process based on nitric acid/acetic acid mixtures

Han, Junfeng ; Fan, Chunjie ; Spanheimer, Christina ; Fu, Ganhua ; Zhao, Kui ; Klein, Andreas ; Jaegermann, Wolfram (2010)
Electrical properties of the CdTe back contact: A new chemically etching process based on nitric acid/acetic acid mixtures.
In: Applied Surface Science, 256
doi: 10.1016/j.apsusc.2010.01.087
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

The performance of the back contact is one of the major issues of CdTe solar cell research. Standard nitric-phosphric (NP) acid chemical etching before metallization is widely used to improve contact formation. However, previous studies of this traditional etching method indicated a blocking Shottky barrier at the back contact, and a roll-over phenomenon was found in the J-V curves of the CdTe solar cells. In this work, a new etching solution, i.e., a nitric-acetic (NA) acid was employed. The etching rate was slow and a Te rich layer was formed on the surface, which was less than 1 nm. The CdTe solar cell with this new etching method showed no roll-over phenomenon and displayed a good ohmic back contact performance. XPS analysis demonstrated that the back contact barrier height was close to those of CdTe with standard NP etching. A possible mechanism was presented for the improvement of back contact properties.

Typ des Eintrags: Artikel
Erschienen: 2010
Autor(en): Han, Junfeng ; Fan, Chunjie ; Spanheimer, Christina ; Fu, Ganhua ; Zhao, Kui ; Klein, Andreas ; Jaegermann, Wolfram
Art des Eintrags: Bibliographie
Titel: Electrical properties of the CdTe back contact: A new chemically etching process based on nitric acid/acetic acid mixtures
Sprache: Englisch
Publikationsjahr: 2010
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Applied Surface Science
Jahrgang/Volume einer Zeitschrift: 256
DOI: 10.1016/j.apsusc.2010.01.087
Kurzbeschreibung (Abstract):

The performance of the back contact is one of the major issues of CdTe solar cell research. Standard nitric-phosphric (NP) acid chemical etching before metallization is widely used to improve contact formation. However, previous studies of this traditional etching method indicated a blocking Shottky barrier at the back contact, and a roll-over phenomenon was found in the J-V curves of the CdTe solar cells. In this work, a new etching solution, i.e., a nitric-acetic (NA) acid was employed. The etching rate was slow and a Te rich layer was formed on the surface, which was less than 1 nm. The CdTe solar cell with this new etching method showed no roll-over phenomenon and displayed a good ohmic back contact performance. XPS analysis demonstrated that the back contact barrier height was close to those of CdTe with standard NP etching. A possible mechanism was presented for the improvement of back contact properties.

Zusätzliche Informationen:

Material- und Geowissenschaften

Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Oberflächenforschung
Hinterlegungsdatum: 29 Okt 2011 08:06
Letzte Änderung: 29 Jan 2019 09:36
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