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An investigation on Point Defects in Silicon Carbide

Puff, W. and Boumerzoug, M. and Brown, J. and Mascher, P. and MacDonald, D. and Simpson, P. J. and Balogh, Adam G. (1995):
An investigation on Point Defects in Silicon Carbide.
In: Applied Physics A: Materials Science and Processing, (1), 61. Springer, pp. 55-58, DOI: 10.1007/BF01538211,
[Article]

Item Type: Article
Erschienen: 1995
Creators: Puff, W. and Boumerzoug, M. and Brown, J. and Mascher, P. and MacDonald, D. and Simpson, P. J. and Balogh, Adam G.
Title: An investigation on Point Defects in Silicon Carbide
Language: English
Journal or Publication Title: Applied Physics A: Materials Science and Processing
Journal volume: 61
Number: 1
Publisher: Springer
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
Date Deposited: 14 Jun 2011 12:52
DOI: 10.1007/BF01538211
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