Wallot, Johanna ; Reynders, Peter ; Herzing, Andrew A. ; Kiely, Christopher J. ; Harmer, Martin P. ; Rödel, Jürgen (2008)
Sintering of thin film nanocrystalline titania–tin oxide composites.
In: Journal of the European Ceramic Society, 28 (11)
doi: 10.1016/j.jeurceramsoc.2008.02.019
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Thin nanocrystalline titania films were sintered on dense substrates with the addition of tin(IV) oxide as a possible grain growth inhibitor. Densification and the development of the pore size distribution were examined via nitrogen adsorption. Aberration-corrected scanning transmission electron microscopy (STEM) and X-ray energy dispersive spectroscopy (XEDS) studies combined with X-ray spectroscopy measurements were carried out to investigate the tin and titanium distribution in the thin films. These studies showed that the additions of SnO2 have little influence on grain growth during sintering of nanocrystalline titania films, but can strongly affect the phase transition from anatase to rutile. The influence of this phase transition during sintering in thin films and the effect on the in-plane biaxial stresses is highlighted.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2008 |
Autor(en): | Wallot, Johanna ; Reynders, Peter ; Herzing, Andrew A. ; Kiely, Christopher J. ; Harmer, Martin P. ; Rödel, Jürgen |
Art des Eintrags: | Bibliographie |
Titel: | Sintering of thin film nanocrystalline titania–tin oxide composites |
Sprache: | Englisch |
Publikationsjahr: | Mai 2008 |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of the European Ceramic Society |
Jahrgang/Volume einer Zeitschrift: | 28 |
(Heft-)Nummer: | 11 |
DOI: | 10.1016/j.jeurceramsoc.2008.02.019 |
Kurzbeschreibung (Abstract): | Thin nanocrystalline titania films were sintered on dense substrates with the addition of tin(IV) oxide as a possible grain growth inhibitor. Densification and the development of the pore size distribution were examined via nitrogen adsorption. Aberration-corrected scanning transmission electron microscopy (STEM) and X-ray energy dispersive spectroscopy (XEDS) studies combined with X-ray spectroscopy measurements were carried out to investigate the tin and titanium distribution in the thin films. These studies showed that the additions of SnO2 have little influence on grain growth during sintering of nanocrystalline titania films, but can strongly affect the phase transition from anatase to rutile. The influence of this phase transition during sintering in thin films and the effect on the in-plane biaxial stresses is highlighted. |
Freie Schlagworte: | Films; Sintering; Phase transformation; TiO2; SnO2 |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Nichtmetallisch-Anorganische Werkstoffe 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
Hinterlegungsdatum: | 18 Mai 2011 15:19 |
Letzte Änderung: | 05 Mär 2013 09:47 |
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