Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Brötz, J. ; Zajac, M. ; Korecki, J. (2010)
Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments.
In: Acta Physica Polonica A, 118 (4)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20¥150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2010 |
| Autor(en): | Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Brötz, J. ; Zajac, M. ; Korecki, J. |
| Art des Eintrags: | Bibliographie |
| Titel: | Interface Properties of Single and Bi-Layer Fe3O4 Films Grown on MgO(001) Studied by RBS and Channeling Experiments |
| Sprache: | Englisch |
| Publikationsjahr: | 2010 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Acta Physica Polonica A |
| Jahrgang/Volume einer Zeitschrift: | 118 |
| (Heft-)Nummer: | 4 |
| Kurzbeschreibung (Abstract): | Series of Fe3O4/MgO(001) and Fe3O4/Fe/MgO(001) films (single- and bi-layer films, respectively) with a total layer thickness in the range of 20¥150 nm were investigated by the Rutherford backscattering spectrometry (2 MeV He+ ion beam), by the Rutherford backscattering spectrometry channeling experiments (1.5 MeV He+ ion beam). Depending on the layer thickness of each layer and the film geometry, a single Fe peak and/or a double-anomaly feature was revealed in the Rutherford backscattering spectra. For all films no magnesium presence in the surface layer was observed. For both single- and bi-layer films with a total layer thickness less than 60 nm only one minimum was observed in the channeling curves, while a double minimum was revealed for the bi-layer films with a larger thickness. X-ray reflectometry measurements have revealed that the film density is the same as that of the bulk one. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 06 Dez 2010 12:47 |
| Letzte Änderung: | 05 Mär 2013 09:42 |
| PPN: | |
| Sponsoren: | The financial support from German Academic Exchange Service (DAAD)-project D/08/07729 (between Germany and Poland) is highly acknowledged., N.-T.H.K.-N. acknowledges the financial support by the Ministry of Science and Higher Education (MNiSW project No. 651N-DAAD/2010/0)., A.G.B. acknowledges the financial support by German Research Foundation (DFG; SFB-595 project)., This work was supported in part by the Team Program of the Foundation for Polish Science co-financed by the EU European Regional Development Fund. |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Frage zum Eintrag |
Optionen (nur für Redakteure)
 |
Redaktionelle Details anzeigen |
Drucken
Impressum