Kluckner, M. ; Brandl, O. ; Weinbruch, S. ; Stadermann, F. J. ; Ortner, H. M. (1997)
A method to correct defocused element distribution maps in electron probe microanalysis.
In: Microchimica Acta, 125 (1)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Element distribution maps obtained on electron microprobes via the beam scan method with wavelength-dispersive spectrometers reveal a defocusing effect if they are taken at sufficiently small magnification. This effect, which occurs where the Bragg condition of the spectrometer is not adequately met, can be avoided or corrected by various methods. A method is presented here to correct defocused element distribution maps with the help of corresponding maps obtained on homogeneous standards.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 1997 |
| Autor(en): | Kluckner, M. ; Brandl, O. ; Weinbruch, S. ; Stadermann, F. J. ; Ortner, H. M. |
| Art des Eintrags: | Bibliographie |
| Titel: | A method to correct defocused element distribution maps in electron probe microanalysis |
| Sprache: | Englisch |
| Publikationsjahr: | März 1997 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Microchimica Acta |
| Jahrgang/Volume einer Zeitschrift: | 125 |
| (Heft-)Nummer: | 1 |
| URL / URN: | http://dx.doi.org/10.1007/BF01246188 |
| Kurzbeschreibung (Abstract): | Element distribution maps obtained on electron microprobes via the beam scan method with wavelength-dispersive spectrometers reveal a defocusing effect if they are taken at sufficiently small magnification. This effect, which occurs where the Bragg condition of the spectrometer is not adequately met, can be avoided or corrected by various methods. A method is presented here to correct defocused element distribution maps with the help of corresponding maps obtained on homogeneous standards. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik |
| Hinterlegungsdatum: | 09 Jul 2010 10:39 |
| Letzte Änderung: | 26 Aug 2018 21:25 |
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