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Diffusion in amorphous NiZrAl alloys

Flege, Stefan ; Hahn, Horst ; Fechner, U. :
Diffusion in amorphous NiZrAl alloys.
In: Journal of non-crystalline solids, 270 (1-3) pp. 123-128.
[Artikel], (2000)

Kurzbeschreibung (Abstract)

Tracer diffusion coefficients for large and small sized impurities were measured in the bulk metallic glass NixZryAlz for several compositions. Molecular beam deposition was employed to grow thin films and secondary ion mass spectrometry was used to determine the concentration-depth profiles of several tracers. A dependence of the atomic mobility of the tracer on its size was found, as observed in the binary NixZry amorphous alloy system. The presence of the Al reduces the diffusion coefficients in general, with a stronger decrease for the small sized tracer. The results support the existence of two different diffusion mechanisms proposed for amorphous metallic alloys.

Typ des Eintrags: Artikel
Erschienen: 2000
Autor(en): Flege, Stefan ; Hahn, Horst ; Fechner, U.
Titel: Diffusion in amorphous NiZrAl alloys
Sprache: Englisch
Kurzbeschreibung (Abstract):

Tracer diffusion coefficients for large and small sized impurities were measured in the bulk metallic glass NixZryAlz for several compositions. Molecular beam deposition was employed to grow thin films and secondary ion mass spectrometry was used to determine the concentration-depth profiles of several tracers. A dependence of the atomic mobility of the tracer on its size was found, as observed in the binary NixZry amorphous alloy system. The presence of the Al reduces the diffusion coefficients in general, with a stronger decrease for the small sized tracer. The results support the existence of two different diffusion mechanisms proposed for amorphous metallic alloys.

Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of non-crystalline solids
Band: 270
(Heft-)Nummer: 1-3
Verlag: Elsevier
Freie Schlagworte: D210, A180, M190
Fachbereich(e)/-gebiet(e): Fachbereich Material- und Geowissenschaften > Materialwissenschaften > Dünne Schichten, Advanced Thin Film Technology
Fachbereich Material- und Geowissenschaften > Materialwissenschaften > Materialanalytik
Fachbereich Material- und Geowissenschaften > Materialwissenschaften
Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 19 Nov 2008 15:59
Sponsoren: This work was supported by the DFG Schwerpunkt-Programm ‘Unterkühlte Metallschmelzen: Phasenselektion und Glasbildung’ Nr. Ha1344/8-1
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