Flege, Stefan ; Hahn, Horst ; Fechner, U. (2000)
Diffusion in amorphous NiZrAl alloys.
In: Journal of non-crystalline solids, 270 (1-3)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Tracer diffusion coefficients for large and small sized impurities were measured in the bulk metallic glass NixZryAlz for several compositions. Molecular beam deposition was employed to grow thin films and secondary ion mass spectrometry was used to determine the concentration-depth profiles of several tracers. A dependence of the atomic mobility of the tracer on its size was found, as observed in the binary NixZry amorphous alloy system. The presence of the Al reduces the diffusion coefficients in general, with a stronger decrease for the small sized tracer. The results support the existence of two different diffusion mechanisms proposed for amorphous metallic alloys.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2000 |
| Autor(en): | Flege, Stefan ; Hahn, Horst ; Fechner, U. |
| Art des Eintrags: | Bibliographie |
| Titel: | Diffusion in amorphous NiZrAl alloys |
| Sprache: | Englisch |
| Publikationsjahr: | 11 Mai 2000 |
| Verlag: | Elsevier |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of non-crystalline solids |
| Jahrgang/Volume einer Zeitschrift: | 270 |
| (Heft-)Nummer: | 1-3 |
| Kurzbeschreibung (Abstract): | Tracer diffusion coefficients for large and small sized impurities were measured in the bulk metallic glass NixZryAlz for several compositions. Molecular beam deposition was employed to grow thin films and secondary ion mass spectrometry was used to determine the concentration-depth profiles of several tracers. A dependence of the atomic mobility of the tracer on its size was found, as observed in the binary NixZry amorphous alloy system. The presence of the Al reduces the diffusion coefficients in general, with a stronger decrease for the small sized tracer. The results support the existence of two different diffusion mechanisms proposed for amorphous metallic alloys. |
| Freie Schlagworte: | D210, A180, M190 |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik |
| Hinterlegungsdatum: | 19 Nov 2008 15:59 |
| Letzte Änderung: | 20 Feb 2020 13:27 |
| PPN: | |
| Sponsoren: | This work was supported by the DFG Schwerpunkt-Programm ‘Unterkühlte Metallschmelzen: Phasenselektion und Glasbildung’ Nr. Ha1344/8-1 |
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