Erb, T. ; Raleva, S. ; Zhokhavets, U. ; Gobsch, G. ; Stühn, B. ; Spode, M. ; Ambacher, O. (2004)
Structural and optical properties of both pure poly (3-octylthiophene) (P3OT) and P3OT/fullerene films.
In: Thin Solid Films, 450 (1)
doi: 10.1016/j.tsf.2003.10.045
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
We have investigated the structural and optical properties of P3OT and P3OT/fullerene thin films in view of their application as active layer in plastic solar cells. Films of these materials were prepared by spin coating from toluene solutions onto silicon substrates. Their optical properties were studied by spectroscopic ellipsometry, which provides the anisotropic dielectric function of the films. Moreover, structural properties were studied using X-ray diffraction. A close correlation between the results obtained by both methods could be found. Especially, the strong optical anisotropy of the films can be explained in terms of a preferable orientation of the polymer chains parallel to the substrate. The effect of the optical anisotropy on the performance of optoelectronic devices is discussed. (C) 2003 Elsevier B.V. All rights reserved.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2004 |
| Autor(en): | Erb, T. ; Raleva, S. ; Zhokhavets, U. ; Gobsch, G. ; Stühn, B. ; Spode, M. ; Ambacher, O. |
| Art des Eintrags: | Bibliographie |
| Titel: | Structural and optical properties of both pure poly (3-octylthiophene) (P3OT) and P3OT/fullerene films |
| Sprache: | Englisch |
| Publikationsjahr: | Februar 2004 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Thin Solid Films |
| Jahrgang/Volume einer Zeitschrift: | 450 |
| (Heft-)Nummer: | 1 |
| DOI: | 10.1016/j.tsf.2003.10.045 |
| Zugehörige Links: | |
| Kurzbeschreibung (Abstract): | We have investigated the structural and optical properties of P3OT and P3OT/fullerene thin films in view of their application as active layer in plastic solar cells. Films of these materials were prepared by spin coating from toluene solutions onto silicon substrates. Their optical properties were studied by spectroscopic ellipsometry, which provides the anisotropic dielectric function of the films. Moreover, structural properties were studied using X-ray diffraction. A close correlation between the results obtained by both methods could be found. Especially, the strong optical anisotropy of the films can be explained in terms of a preferable orientation of the polymer chains parallel to the substrate. The effect of the optical anisotropy on the performance of optoelectronic devices is discussed. (C) 2003 Elsevier B.V. All rights reserved. |
| Zusätzliche Informationen: | Symposium on Optical and X-Ray Metrology for Advanced Device Materials Characterization, Strasbourg, France, Jun 10-13, 2003 |
| Fachbereich(e)/-gebiet(e): | 05 Fachbereich Physik > Institut für Festkörperphysik (2021 umbenannt in Institut für Physik Kondensierter Materie (IPKM)) 05 Fachbereich Physik |
| Hinterlegungsdatum: | 27 Feb 2010 13:28 |
| Letzte Änderung: | 05 Mär 2013 09:32 |
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