Roy Chowdhury, Dibakar (2008)
Experimental study and modelling of AC characteristics of resonant Tunnelling Diodes.
Technische Universität Darmstadt
Dissertation, Erstveröffentlichung
Kurzbeschreibung (Abstract)
In this thesis work, the small-signal response of the resonant tunneling diode at dierent frequencies is studied. It has been shown previously that because of the Coulomb interaction, the inherent limitation of the operating frequency and the charge relaxation (response) time of resonant tunneling diode (RTD) is not due to the resonant state lifetime [1], contrary to the general belief [2, 3]. Here we have experimentally shown that intrinsic response time of RTD is dierent than the resonant state lifetime and the operating frequencies of RTD is limited neither by the resonant state lifetime nor by the intrinsic response time. In fact we have experimentally demonstrated negative differential conductance (NDC) far beyond the resonant state lifetime limit which clearly proves that resonant tunneling exists at frequencies beyond the resonant state lifetime limit. Using the analytically derived equivalent circuit [1], the measured frequency response of the RTD admittances (conductances and susceptances) as well the special features of RTD capacitances at low frequencies are reproduced well. So we have experimentally shown that the proposed simple equivalent circuit for small signal analysis of RTD is correct and appropriate.
Typ des Eintrags: | Dissertation | ||||
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Erschienen: | 2008 | ||||
Autor(en): | Roy Chowdhury, Dibakar | ||||
Art des Eintrags: | Erstveröffentlichung | ||||
Titel: | Experimental study and modelling of AC characteristics of resonant Tunnelling Diodes | ||||
Sprache: | Englisch | ||||
Referenten: | Meissner, Prof. Dr. Peter ; Hartnagel, Prof. Dr. Hans. L. | ||||
Publikationsjahr: | 9 November 2008 | ||||
Ort: | Darmstadt | ||||
Verlag: | Technische Universität | ||||
Datum der mündlichen Prüfung: | 23 Juni 2008 | ||||
URL / URN: | urn:nbn:de:tuda-tuprints-11988 | ||||
Kurzbeschreibung (Abstract): | In this thesis work, the small-signal response of the resonant tunneling diode at dierent frequencies is studied. It has been shown previously that because of the Coulomb interaction, the inherent limitation of the operating frequency and the charge relaxation (response) time of resonant tunneling diode (RTD) is not due to the resonant state lifetime [1], contrary to the general belief [2, 3]. Here we have experimentally shown that intrinsic response time of RTD is dierent than the resonant state lifetime and the operating frequencies of RTD is limited neither by the resonant state lifetime nor by the intrinsic response time. In fact we have experimentally demonstrated negative differential conductance (NDC) far beyond the resonant state lifetime limit which clearly proves that resonant tunneling exists at frequencies beyond the resonant state lifetime limit. Using the analytically derived equivalent circuit [1], the measured frequency response of the RTD admittances (conductances and susceptances) as well the special features of RTD capacitances at low frequencies are reproduced well. So we have experimentally shown that the proposed simple equivalent circuit for small signal analysis of RTD is correct and appropriate. |
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Alternatives oder übersetztes Abstract: |
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Freie Schlagworte: | Resonant Tunnelling Diode, Coulomb interaction effect, resonant state lifetime, charge relaxation time, RTD response time, GHz, THz | ||||
Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften und Maschinenbau | ||||
Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > Photonik und Optische Nachrichtentechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) |
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Hinterlegungsdatum: | 17 Dez 2008 08:39 | ||||
Letzte Änderung: | 26 Aug 2018 21:25 | ||||
PPN: | |||||
Referenten: | Meissner, Prof. Dr. Peter ; Hartnagel, Prof. Dr. Hans. L. | ||||
Datum der mündlichen Prüfung / Verteidigung / mdl. Prüfung: | 23 Juni 2008 | ||||
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