Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Meyer, J. D. ; Brötz, J. ; Hummelt, Stefan ; Zajac, M. ; Slezak, T. ; Korecki, J. (2009)
Thermal and irradiation induced interdiffusion in Fe3O4/MgO(0 0 1) thin film.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267 (8-9)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The interface reactions in an epitaxial 10 nm-thick Fe3O4/MgO(0 0 1) film were investigated by using Rutherford Backscattering spectrometry (RBS), channeling (RBS-C) and X-ray reflectometry (XRR). The as-grown film had a good crystallinity indicated by the minimum yield and the half-angle value for Fe, respectively, [chi]min(Fe) = 22% and [psi]1/2(Fe) = 0.62°. Annealing the films under partial argon pressure up to 600 °C led to a large enhancement of Mg out-diffusion into the film forming a wustite-type phase, but the total layer thickness did not change much. Ion irradiation of the film by 1 MeV Ar ion beam caused a strong Fe ion mixing resulting in a large interfacial zone with a thickness of 23 nm.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2009 |
| Autor(en): | Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Meyer, J. D. ; Brötz, J. ; Hummelt, Stefan ; Zajac, M. ; Slezak, T. ; Korecki, J. |
| Art des Eintrags: | Bibliographie |
| Titel: | Thermal and irradiation induced interdiffusion in Fe3O4/MgO(0 0 1) thin film |
| Sprache: | Englisch |
| Publikationsjahr: | 1 Mai 2009 |
| Verlag: | Elsevier Science Publishing Company |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
| Jahrgang/Volume einer Zeitschrift: | 267 |
| (Heft-)Nummer: | 8-9 |
| URL / URN: | http://www.sciencedirect.com/science/article/B6TJN-4VGWM5P-G... |
| Kurzbeschreibung (Abstract): | The interface reactions in an epitaxial 10 nm-thick Fe3O4/MgO(0 0 1) film were investigated by using Rutherford Backscattering spectrometry (RBS), channeling (RBS-C) and X-ray reflectometry (XRR). The as-grown film had a good crystallinity indicated by the minimum yield and the half-angle value for Fe, respectively, [chi]min(Fe) = 22% and [psi]1/2(Fe) = 0.62°. Annealing the films under partial argon pressure up to 600 °C led to a large enhancement of Mg out-diffusion into the film forming a wustite-type phase, but the total layer thickness did not change much. Ion irradiation of the film by 1 MeV Ar ion beam caused a strong Fe ion mixing resulting in a large interfacial zone with a thickness of 23 nm. |
| Freie Schlagworte: | CEMS, Channeling, Magnetite Fe3O4, MBE, RBS, XRR |
| Zusätzliche Informationen: | Proceedings of the 16th International Conference on Ion Beam Modification of Materials |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Strukturforschung 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 15 Jul 2009 12:48 |
| Letzte Änderung: | 05 Mär 2013 09:20 |
| PPN: | |
| Sponsoren: | The financial support from the International Bureau of BMBF (project MOE 07/R61 between Germany and Poland) is highly acknowledged., A.G.B. gratefully acknowledges the financial support by German Research Foundation (DFG) within the frame of the Center of Excellence SFB-595 project., N.-T.H. Kim-Ngan appreciates the financial support by the Ministry of Science and Higher Education through the statutory funds for the Faculty of Mathematics, Physics and Techniques, Pedagogical University, Kraków. |
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