Kim-Ngan, N.-T. H. ; Balogh, Adam G. ; Meyer, J. D. ; Brötz, Joachim ; Hummelt, Stefan ; Zajac, M. ; Slezak, T. ; Korecki, J. (2008)
Structure, composition and crystallinity of epitaxial magnetite thin films.
In: Surface Science, 602 (14)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Epitaxially-grown Fe3O4(0 0 1) thin films by reactive deposition on MgO(1 0 0) substrates were studied using low-energy electron diffraction (LEED), conversion electron Mössbauer spectroscopy (CEMS), Rutherford backscattering spectrometry (RBS), channeling (RBS-C) experiments and X-ray reflectometry (XRR). No visible influence from the ion irradiation of the samples on the CEMS spectra was found, while surface oxidation of the samples was observed after exposure to the atmospheric pressure. RBS analysis indicated the presence of magnesium with an average amount of 3% in the films. RBS-C experiments yielded a value of 22% for the minimum yield of Fe and a value of 0.62° for the half-angle for Fe in the film indicating a good crystal quality of the films. The value for film-thickness obtained from XRR is in a good agreement with that from RBS and the nominal value.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2008 |
| Autor(en): | Kim-Ngan, N.-T. H. ; Balogh, Adam G. ; Meyer, J. D. ; Brötz, Joachim ; Hummelt, Stefan ; Zajac, M. ; Slezak, T. ; Korecki, J. |
| Art des Eintrags: | Bibliographie |
| Titel: | Structure, composition and crystallinity of epitaxial magnetite thin films |
| Sprache: | Englisch |
| Publikationsjahr: | 15 Juli 2008 |
| Verlag: | Elsevier Science Publishing Company |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Surface Science |
| Jahrgang/Volume einer Zeitschrift: | 602 |
| (Heft-)Nummer: | 14 |
| URL / URN: | http://www.sciencedirect.com/science/article/B6TVX-4SGD4N2-1... |
| Kurzbeschreibung (Abstract): | Epitaxially-grown Fe3O4(0 0 1) thin films by reactive deposition on MgO(1 0 0) substrates were studied using low-energy electron diffraction (LEED), conversion electron Mössbauer spectroscopy (CEMS), Rutherford backscattering spectrometry (RBS), channeling (RBS-C) experiments and X-ray reflectometry (XRR). No visible influence from the ion irradiation of the samples on the CEMS spectra was found, while surface oxidation of the samples was observed after exposure to the atmospheric pressure. RBS analysis indicated the presence of magnesium with an average amount of 3% in the films. RBS-C experiments yielded a value of 22% for the minimum yield of Fe and a value of 0.62° for the half-angle for Fe in the film indicating a good crystal quality of the films. The value for film-thickness obtained from XRR is in a good agreement with that from RBS and the nominal value. |
| Freie Schlagworte: | RBS; Channeling; MBE; CEMS; Magnetite Fe3O4; X-ray reflectometry |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Strukturforschung 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 06 Jul 2009 13:52 |
| Letzte Änderung: | 05 Mär 2013 09:20 |
| PPN: | |
| Sponsoren: | The financial support from the International Bureau of BMBF (Project MOE 07/R61 between Germany and Poland) is highly acknowledged., This work is partially supported by the Ministry of Science and Higher Education through the statutory funds for the Faculty of Mathematics, Physics and Techniques, Pedagogical University, Kraków. |
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