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Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates

Baake, Olaf and Öksüzoglu, Ramis M. and Flege, Stefan and Hoffmann, P. S. and Gottschalk, S. and Fuess, H. and Ortner, H. M. (2006):
Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates.
57, In: Materials Characterization, (1), pp. 12 - 16, [Online-Edition: http://www.sciencedirect.com/science/article/B6TXJ-4HXBGRX-1...],
[Article]

Item Type: Article
Erschienen: 2006
Creators: Baake, Olaf and Öksüzoglu, Ramis M. and Flege, Stefan and Hoffmann, P. S. and Gottschalk, S. and Fuess, H. and Ortner, H. M.
Title: Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates
Language: English
Journal or Publication Title: Materials Characterization
Volume: 57
Number: 1
Uncontrolled Keywords: X-ray reflectometry
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 17 Jun 2009 11:44
Official URL: http://www.sciencedirect.com/science/article/B6TXJ-4HXBGRX-1...
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