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Charge retention in biaxially-oriented polypropylene films containing various additives

Hillenbrand, J. ; Behrendt, N. ; Mohmeyer, M. ; Schmidt, H.-W. ; Sessler, Gerhard M. (2005)
Charge retention in biaxially-oriented polypropylene films containing various additives.
12th International Symposium on Electrets. Salvador, Brazil (11.09.2005-14.09.2005)
doi: 10.1109/ISE.2005.1612375
Konferenzveröffentlichung, Bibliographie

Kurzbeschreibung (Abstract)

Isotactic Polypropylene (i-PP) films containing additives such as the commercial /spl alpha/-nucleation agent NA11 and the anorganic filler particles CaCO/sub 3/ and Al/sub 2/O/sub 3/ were biaxially stretched. As a result, the films assume a cellular morphology with oblong cavities extending in the direction of the film elongation. In the present study, stretched films of 50 /spl mu/m thickness with additive concentrations of 0.05 to 10 mass percent were charged with a corona method to potentials of 400 V or 500 V. The stability of the charges was tested isothermally at temperatures of 90 /spl deg/C and 120 /spl deg/C and by means of thermally stimulated discharge (TSD) experiments. The isothermal measurements show, for the above additives with concentrations higher than about 03 %, a reduction of the charge decay with increasing additive concentrations. Compared to reference films of pure PP, the potential decay of the films containing additive concentrations of 10 % is significantly reduced. Correspondingly, the TSD measurements indicate a shift of the main discharge peak to higher temperatures up to the melting temperature. Generally, the voiding and thus the stability also increases with the stretching ratio. These improvements of the charge stability are attributed to the barrier effect of the cavities. The results are of interest with respect to the various applications of PP electrets, such as ferroelectret devices and air filters.

Typ des Eintrags: Konferenzveröffentlichung
Erschienen: 2005
Autor(en): Hillenbrand, J. ; Behrendt, N. ; Mohmeyer, M. ; Schmidt, H.-W. ; Sessler, Gerhard M.
Art des Eintrags: Bibliographie
Titel: Charge retention in biaxially-oriented polypropylene films containing various additives
Sprache: Deutsch
Publikationsjahr: 2005
Ort: Piscataway, NJ
Verlag: IEEE Operations Center
Buchtitel: ISE12. 12th International Symposium on Electrets : proceedings
Veranstaltungstitel: 12th International Symposium on Electrets
Veranstaltungsort: Salvador, Brazil
Veranstaltungsdatum: 11.09.2005-14.09.2005
DOI: 10.1109/ISE.2005.1612375
Kurzbeschreibung (Abstract):

Isotactic Polypropylene (i-PP) films containing additives such as the commercial /spl alpha/-nucleation agent NA11 and the anorganic filler particles CaCO/sub 3/ and Al/sub 2/O/sub 3/ were biaxially stretched. As a result, the films assume a cellular morphology with oblong cavities extending in the direction of the film elongation. In the present study, stretched films of 50 /spl mu/m thickness with additive concentrations of 0.05 to 10 mass percent were charged with a corona method to potentials of 400 V or 500 V. The stability of the charges was tested isothermally at temperatures of 90 /spl deg/C and 120 /spl deg/C and by means of thermally stimulated discharge (TSD) experiments. The isothermal measurements show, for the above additives with concentrations higher than about 03 %, a reduction of the charge decay with increasing additive concentrations. Compared to reference films of pure PP, the potential decay of the films containing additive concentrations of 10 % is significantly reduced. Correspondingly, the TSD measurements indicate a shift of the main discharge peak to higher temperatures up to the melting temperature. Generally, the voiding and thus the stability also increases with the stretching ratio. These improvements of the charge stability are attributed to the barrier effect of the cavities. The results are of interest with respect to the various applications of PP electrets, such as ferroelectret devices and air filters.

Fachbereich(e)/-gebiet(e): 18 Fachbereich Elektrotechnik und Informationstechnik
Hinterlegungsdatum: 20 Nov 2008 08:26
Letzte Änderung: 22 Nov 2024 07:56
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