Heil, Holger ; Andress, G. ; Schmechel, Roland ; Seggern, Heinz von ; Steiger, Jürgen ; Bonrad, K. ; Spengard, R. (2005)
Sunlight stability of organic light emitting diodes.
In: Journal of applied physics, 97 (12)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
This paper reports on the photodegradation of organic light-emitting diodes (OLEDs) due to exposure to visible and near-ultraviolet light. Such exposure affects strongly the device performance, e.g., the electroluminescence intensity and the device current decrease considerably, however, the photoluminescence remains unaffected. This photodegradation was investigated on various production-relevant classes of high-quality polymer semiconductors with different energy gaps, i.e., a yellowish-green polyphenylenevinylene derivative, a red polyfluorene derivative, and a blue polyspiro derivative. It will be demonstrated that the action spectrum of the photodegradation is strongly correlated with the fundamental absorption of the polymer itself. The indium-doped tin oxide (ITO) polymer interface was identified as the interface where photodegradation takes place, while the bulk of each layer (ITO or polymer) turned out to be insensitive to irradiation with visible or near-ultraviolet light. Furthermore, it is demonstrated that the photoinduced damage can be suppressed by inserting appropriate interlayer systems.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2005 |
| Autor(en): | Heil, Holger ; Andress, G. ; Schmechel, Roland ; Seggern, Heinz von ; Steiger, Jürgen ; Bonrad, K. ; Spengard, R. |
| Art des Eintrags: | Bibliographie |
| Titel: | Sunlight stability of organic light emitting diodes |
| Sprache: | Englisch |
| Publikationsjahr: | Juni 2005 |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of applied physics |
| Jahrgang/Volume einer Zeitschrift: | 97 |
| (Heft-)Nummer: | 12 |
| URL / URN: | http://dx.doi.org/10.1063/1.1935130 |
| Kurzbeschreibung (Abstract): | This paper reports on the photodegradation of organic light-emitting diodes (OLEDs) due to exposure to visible and near-ultraviolet light. Such exposure affects strongly the device performance, e.g., the electroluminescence intensity and the device current decrease considerably, however, the photoluminescence remains unaffected. This photodegradation was investigated on various production-relevant classes of high-quality polymer semiconductors with different energy gaps, i.e., a yellowish-green polyphenylenevinylene derivative, a red polyfluorene derivative, and a blue polyspiro derivative. It will be demonstrated that the action spectrum of the photodegradation is strongly correlated with the fundamental absorption of the polymer itself. The indium-doped tin oxide (ITO) polymer interface was identified as the interface where photodegradation takes place, while the bulk of each layer (ITO or polymer) turned out to be insensitive to irradiation with visible or near-ultraviolet light. Furthermore, it is demonstrated that the photoinduced damage can be suppressed by inserting appropriate interlayer systems. |
| Freie Schlagworte: | indium compounds, organic semiconductors, polymers, organic light emitting diodes, electroluminescence, photoluminescence, energy gap, ultraviolet radiation effects |
| Zusätzliche Informationen: | SFB 595 D4 |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften DFG-Sonderforschungsbereiche (inkl. Transregio) DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche Zentrale Einrichtungen DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > D - Bauteileigenschaften DFG-Sonderforschungsbereiche (inkl. Transregio) > Sonderforschungsbereiche > SFB 595: Elektrische Ermüdung > D - Bauteileigenschaften > Teilprojekt D4: Betriebsbedingte Ermüdung von Bauelementen aus organischen Halbleitern |
| Hinterlegungsdatum: | 20 Nov 2008 08:24 |
| Letzte Änderung: | 20 Feb 2020 13:24 |
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