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Spectroscopic ellipsometry on opaline photonic crystals

Ahles, Marcus ; Ruhl, Tilmann ; Hellmann, Goetz Peter ; Winkler, H. ; Schmechel, Roland ; Seggern, Heinz von :
Spectroscopic ellipsometry on opaline photonic crystals.
[Online-Edition: http://www.sciencedirect.com/science/article/pii/S0030401804...]
In: Optics communications, 246 (1-3) pp. 1-7.
[Artikel], (2005)

Offizielle URL: http://www.sciencedirect.com/science/article/pii/S0030401804...

Kurzbeschreibung (Abstract)

In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted.

Typ des Eintrags: Artikel
Erschienen: 2005
Autor(en): Ahles, Marcus ; Ruhl, Tilmann ; Hellmann, Goetz Peter ; Winkler, H. ; Schmechel, Roland ; Seggern, Heinz von
Titel: Spectroscopic ellipsometry on opaline photonic crystals
Sprache: Englisch
Kurzbeschreibung (Abstract):

In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted.

Titel der Zeitschrift, Zeitung oder Schriftenreihe: Optics communications
Band: 246
(Heft-)Nummer: 1-3
Verlag: Elsevier Science Publishing
Freie Schlagworte: Opal, Photonic crystal, Colloid, Ellipsometry
Fachbereich(e)/-gebiet(e): Fachbereich Material- und Geowissenschaften > Materialwissenschaften > Elektronische Materialeigenschaften
Fachbereich Material- und Geowissenschaften > Materialwissenschaften
Fachbereich Material- und Geowissenschaften
Hinterlegungsdatum: 20 Nov 2008 08:23
Offizielle URL: http://www.sciencedirect.com/science/article/pii/S0030401804...
Sponsoren: The authors would like to thank the German Research Foundation DFG for the spectroscopic ellipsometer which is an item on loan..
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