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Spectroscopic ellipsometry on opaline photonic crystals

Ahles, Marcus and Ruhl, Tilmann and Hellmann, Goetz Peter and Winkler, H. and Schmechel, Roland and Seggern, Heinz von (2005):
Spectroscopic ellipsometry on opaline photonic crystals.
In: Optics communications, 246 (1-3), Elsevier Science Publishing, pp. 1-7, [Online-Edition: http://www.sciencedirect.com/science/article/pii/S0030401804...],
[Article]

Abstract

In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted.

Item Type: Article
Erschienen: 2005
Creators: Ahles, Marcus and Ruhl, Tilmann and Hellmann, Goetz Peter and Winkler, H. and Schmechel, Roland and Seggern, Heinz von
Title: Spectroscopic ellipsometry on opaline photonic crystals
Language: English
Abstract:

In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted.

Journal or Publication Title: Optics communications
Volume: 246
Number: 1-3
Publisher: Elsevier Science Publishing
Uncontrolled Keywords: Opal, Photonic crystal, Colloid, Ellipsometry
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Electronic Materials
Date Deposited: 20 Nov 2008 08:23
Official URL: http://www.sciencedirect.com/science/article/pii/S0030401804...
License: [undefiniert]
Funders: The authors would like to thank the German Research Foundation DFG for the spectroscopic ellipsometer which is an item on loan..
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