Ahles, Marcus ; Ruhl, Tilmann ; Hellmann, Götz Peter ; Winkler, H. ; Schmechel, Roland ; Seggern, Heinz von (2005)
Spectroscopic ellipsometry on opaline photonic crystals.
In: Optics communications, 246 (1-3)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2005 |
| Autor(en): | Ahles, Marcus ; Ruhl, Tilmann ; Hellmann, Götz Peter ; Winkler, H. ; Schmechel, Roland ; Seggern, Heinz von |
| Art des Eintrags: | Bibliographie |
| Titel: | Spectroscopic ellipsometry on opaline photonic crystals |
| Sprache: | Englisch |
| Publikationsjahr: | 1 Februar 2005 |
| Verlag: | Elsevier Science Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Optics communications |
| Jahrgang/Volume einer Zeitschrift: | 246 |
| (Heft-)Nummer: | 1-3 |
| URL / URN: | http://www.sciencedirect.com/science/article/pii/S0030401804... |
| Kurzbeschreibung (Abstract): | In the present paper, the optical and structural properties of an opaline photonic crystal consisting of a closest packing of nanospheres have been studied via spectroscopic ellipsometry. This method allows for a non-destructive determination of the effective refractive index without any assumption on material properties. Further we are able to gather information about the structural constitution of the opal by introducing a multi-layer model. The layer distance and the maximum size of the nanospheres can be extracted. |
| Freie Schlagworte: | Opal, Photonic crystal, Colloid, Ellipsometry |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Elektronische Materialeigenschaften |
| Hinterlegungsdatum: | 20 Nov 2008 08:23 |
| Letzte Änderung: | 10 Apr 2024 07:27 |
| PPN: | |
| Sponsoren: | The authors would like to thank the German Research Foundation DFG for the spectroscopic ellipsometer which is an item on loan.. |
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