Ficker, Jürgen ; Seggern, Heinz von ; Rost, H. ; Fix, W. ; Clemens, W. ; McCulloch, I. (2004)
Influence of intensive light exposure on polymer field-effect transistors.
In: Applied Physics Letters, 85 (8)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The influence of intensive light exposure on high performance polymer field-effect transistors containing highly regioregular poly(3-alkylthiophene) as a semiconductor is reported. While the transistors show high stability under ambient air and light, a distinct degradation upon exposure to intensive light could be detected by its impact on the on currents. UV-Vis spectra were used to interpret the current decrease as being caused by a decrease of the conjugation length of the semiconductor, which is supported by IR spectrometry. The role of ambient air, in particular, oxygen, in the degradation process is shown.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2004 |
| Autor(en): | Ficker, Jürgen ; Seggern, Heinz von ; Rost, H. ; Fix, W. ; Clemens, W. ; McCulloch, I. |
| Art des Eintrags: | Bibliographie |
| Titel: | Influence of intensive light exposure on polymer field-effect transistors |
| Sprache: | Englisch |
| Publikationsjahr: | 23 August 2004 |
| Verlag: | American Institute of Physics Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Physics Letters |
| Jahrgang/Volume einer Zeitschrift: | 85 |
| (Heft-)Nummer: | 8 |
| Kurzbeschreibung (Abstract): | The influence of intensive light exposure on high performance polymer field-effect transistors containing highly regioregular poly(3-alkylthiophene) as a semiconductor is reported. While the transistors show high stability under ambient air and light, a distinct degradation upon exposure to intensive light could be detected by its impact on the on currents. UV-Vis spectra were used to interpret the current decrease as being caused by a decrease of the conjugation length of the semiconductor, which is supported by IR spectrometry. The role of ambient air, in particular, oxygen, in the degradation process is shown. |
| Freie Schlagworte: | organic semiconductors, semiconductor thin films, insulated gate field effect transistors, electrical conductivity, ultraviolet spectra, visible spectra, infrared spectra |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Elektronische Materialeigenschaften |
| Hinterlegungsdatum: | 20 Nov 2008 08:19 |
| Letzte Änderung: | 20 Feb 2020 13:25 |
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