Bulska, E. ; Jedral, W. ; Kopysc, E. ; Ortner, Hugo M. ; Flege, Stefan (2002)
Secondary ion mass spectrometry for characterizing antimony, arsenic and selenium on graphite surfaces modified with noble metals and used for hydride generation atomic absorption spectrometry.
In: Spectrochimica acta : Part B, 57 (12)
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The surface and sub-surface distribution of noble metals (after electrodeposition of 600 μg or thermal reduction of 10 μg as modifiers), as well as Sb, As and Se (200 ng) as analytes after their deposition on the graphite surface was investigated using secondary ion mass spectrometry (SIMS) in the dynamic mode. This permitted simultaneous observation of the depth profile distribution of modifier and analyte with a depth resolution of down to approximately 25 nm, limited however, by the surface roughness of the samples. Hydride generation was intentionally used for this purpose because in this approach the investigated system: graphite–modifier with added analyte is free from matrix components. This was essential for the evaluation of this novel approach using SIMS for surface analysis. Investigations concerning the distribution of analytes were performed on the graphite surface modified with palladium, iridium or rhodium. It was found that after deposition at 400 °C, all analytes partially penetrated the graphite surface and their distribution overlaps the distribution pattern of the noble metals. The degree of penetration differs for each analyte and depends on the modifier used.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2002 |
| Autor(en): | Bulska, E. ; Jedral, W. ; Kopysc, E. ; Ortner, Hugo M. ; Flege, Stefan |
| Art des Eintrags: | Bibliographie |
| Titel: | Secondary ion mass spectrometry for characterizing antimony, arsenic and selenium on graphite surfaces modified with noble metals and used for hydride generation atomic absorption spectrometry |
| Sprache: | Englisch |
| Publikationsjahr: | 2002 |
| Verlag: | Elsevier |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Spectrochimica acta : Part B |
| Jahrgang/Volume einer Zeitschrift: | 57 |
| (Heft-)Nummer: | 12 |
| Kurzbeschreibung (Abstract): | The surface and sub-surface distribution of noble metals (after electrodeposition of 600 μg or thermal reduction of 10 μg as modifiers), as well as Sb, As and Se (200 ng) as analytes after their deposition on the graphite surface was investigated using secondary ion mass spectrometry (SIMS) in the dynamic mode. This permitted simultaneous observation of the depth profile distribution of modifier and analyte with a depth resolution of down to approximately 25 nm, limited however, by the surface roughness of the samples. Hydride generation was intentionally used for this purpose because in this approach the investigated system: graphite–modifier with added analyte is free from matrix components. This was essential for the evaluation of this novel approach using SIMS for surface analysis. Investigations concerning the distribution of analytes were performed on the graphite surface modified with palladium, iridium or rhodium. It was found that after deposition at 400 °C, all analytes partially penetrated the graphite surface and their distribution overlaps the distribution pattern of the noble metals. The degree of penetration differs for each analyte and depends on the modifier used. |
| Freie Schlagworte: | Modifier and analyte spatial distribution, Depth profiles, Hydride generation and trapping of Sb, As and Se, Graphite platform, Secondary ion mass spectrometry |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik |
| Hinterlegungsdatum: | 19 Nov 2008 16:29 |
| Letzte Änderung: | 17 Apr 2020 09:18 |
| PPN: | |
| Sponsoren: | This research was carried out in the framework of the KBN 7 T09A 05320 grant from the Committee for Scientific Research, Poland. |
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