Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf (2000)
Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis.
Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography. Denver, Colorado (08.08.1996-08.08.1996)
doi: 10.1023/A:1004727401914
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2000 |
| Autor(en): | Nicolich, Jeffrey P. ; Lences, Z. ; Dreßler, W. ; Riedel, Ralf |
| Art des Eintrags: | Bibliographie |
| Titel: | Phase quantification of ß-Si3N4/ß-SiC mixtures by X-ray powder diffraction analysis |
| Sprache: | Englisch |
| Publikationsjahr: | 2000 |
| Verlag: | KLUWER ACADEMIC PUBL, Netherlands |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of materials science |
| (Heft-)Nummer: | 6 |
| Reihe: | Journal of Materials Science |
| Band einer Reihe: | 35(6) |
| Veranstaltungstitel: | Joint Meeting of the 45th Annual Denver X-Ray Conference / Powder Diffraction Satellite Meeting of the XVIIth Congress of the International-Union-of-Crystallography |
| Veranstaltungsort: | Denver, Colorado |
| Veranstaltungsdatum: | 08.08.1996-08.08.1996 |
| DOI: | 10.1023/A:1004727401914 |
| Kurzbeschreibung (Abstract): | X-ray powder diffraction methods of phase quantification were adapted and compared to mixtures of -Si3N4 and -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results. |
| Freie Schlagworte: | Ceramics |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Disperse Feststoffe |
| Hinterlegungsdatum: | 19 Nov 2008 16:27 |
| Letzte Änderung: | 22 Aug 2018 08:17 |
| PPN: | |
| Sponsoren: | Financial support by the federal ministry of education and research, Bonn, project number WTZ SLAX262.11 and the Fonds der Chemischen Industrie, Frankfurt, is gratefully acknowledged. |
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