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Transient deformation measurement with electronic speckle pattern interferomety by use of a holographic optical element for spatial phase stepping

Garcia, Bernardino Barrientos ; Moore, A. J. ; Perez-Lopez, C. ; Wang, L. ; Tschudi, Theo (1999):
Transient deformation measurement with electronic speckle pattern interferomety by use of a holographic optical element for spatial phase stepping.
38, In: Applied optics, [Article]

Item Type: Article
Erschienen: 1999
Creators: Garcia, Bernardino Barrientos ; Moore, A. J. ; Perez-Lopez, C. ; Wang, L. ; Tschudi, Theo
Title: Transient deformation measurement with electronic speckle pattern interferomety by use of a holographic optical element for spatial phase stepping
Language: English
Journal or Publication Title: Applied optics
Volume: 38
Divisions: 05 Department of Physics
Date Deposited: 19 Nov 2008 16:26
License: [undefiniert]
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