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Simulation of prebreakdown phenomena at a gas/solid interface in a 10 % SF6/N2 mixture stressed by very fast transient voltages

Pfeiffer, Wolfgang and Schoen, D. and Tong, L. Z. (2000):
Simulation of prebreakdown phenomena at a gas/solid interface in a 10 % SF6/N2 mixture stressed by very fast transient voltages.
In: IEEE International Symposium on Electrical Insulation <2000, Anaheim, CA>: Proceedings. S. 408-411. - Piscataway, NY: IEEE Service Center, 2000, Piscataway, NY, IEEE Service Center, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2000
Creators: Pfeiffer, Wolfgang and Schoen, D. and Tong, L. Z.
Title: Simulation of prebreakdown phenomena at a gas/solid interface in a 10 % SF6/N2 mixture stressed by very fast transient voltages
Language: English
Series Name: IEEE International Symposium on Electrical Insulation <2000, Anaheim, CA>: Proceedings. S. 408-411. - Piscataway, NY: IEEE Service Center, 2000
Place of Publication: Piscataway, NY
Publisher: IEEE Service Center
Divisions: 18 Department of Electrical Engineering and Information Technology
Date Deposited: 19 Nov 2008 16:25
License: [undefiniert]
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