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A method for HBT process control and defect detection using pulsed electrical stress

Sydlo, Cezary and Mottet, B. and Schüßler, M. and Brandt, M. and Hartnagel, H. L. (2000):
A method for HBT process control and defect detection using pulsed electrical stress.
Oxford, Pergamon, In: ESREF 2000: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <11, 2000, Dresden>: Proceedings. S. 1449-1453. - Oxford: Pergamon, 2000, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2000
Creators: Sydlo, Cezary and Mottet, B. and Schüßler, M. and Brandt, M. and Hartnagel, H. L.
Title: A method for HBT process control and defect detection using pulsed electrical stress
Language: English
Series Name: ESREF 2000: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <11, 2000, Dresden>: Proceedings. S. 1449-1453. - Oxford: Pergamon, 2000
Place of Publication: Oxford
Publisher: Pergamon
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:25
License: [undefiniert]
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