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Longitudinal bunch diagnostics in the Terahertz domain at TELBE using fast room temperature operable zero-bias Schottky diodes

Yadav, Rahul ; Kuntzsch, Michael ; Penirschke, Andreas ; Preu, Sascha (2025)
Longitudinal bunch diagnostics in the Terahertz domain at TELBE using fast room temperature operable zero-bias Schottky diodes.
IBIC2024-13th International Beam Instrumentation Conference. Bejing, China (09.09.2024-13.09.2024)
doi: 10.26083/tuprints-00028654
Konferenzveröffentlichung, Zweitveröffentlichung, Verlagsversion

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Kurzbeschreibung (Abstract)

Modern accelerator-based light sources rely on short bunches to generate intense photon pulses. To achieve this, the electron bunches from the accelerator need to be compressed longitudinally in a magnetic chicane. A valuable tool for the measurement of the signal in the bunch compressor is the use of broadband EM-detectors covering a spectral range from few 100 GHz up to THz frequencies. With this setup, bunch length variations caused by instabilities in the acceleration process can be measured that in turn also affects the secondary photon beam. In this paper, we demonstrate the pre-commissioning of broadband, room temperature Schottky THz detectors for the diagnosis of compressed short electron bunches at the TELBE facilities at the Helmholtz-Zentrum Dresden-Rossendorf, Germany. Qualitative bunch compression measurements have been carried out to diagnose the beam to optimize the machine setup and provide feedback to the beam-line scientists for optimum machine operation. These detectors are scheduled to be commissioned at free-electron facilities in near-future.

Typ des Eintrags: Konferenzveröffentlichung
Erschienen: 2025
Autor(en): Yadav, Rahul ; Kuntzsch, Michael ; Penirschke, Andreas ; Preu, Sascha
Art des Eintrags: Zweitveröffentlichung
Titel: Longitudinal bunch diagnostics in the Terahertz domain at TELBE using fast room temperature operable zero-bias Schottky diodes
Sprache: Englisch
Publikationsjahr: 9 Januar 2025
Ort: Darmstadt
Publikationsdatum der Erstveröffentlichung: 17 September 2024
Ort der Erstveröffentlichung: Geneva, Switzerland
Verlag: JACoW Publishing
Buchtitel: Proceedings of the 13th International Beam Instrumentation Conference
Kollation: 4 Seiten
Veranstaltungstitel: IBIC2024-13th International Beam Instrumentation Conference
Veranstaltungsort: Bejing, China
Veranstaltungsdatum: 09.09.2024-13.09.2024
DOI: 10.26083/tuprints-00028654
URL / URN: https://tuprints.ulb.tu-darmstadt.de/28654
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Herkunft: Zweitveröffentlichungsservice
Kurzbeschreibung (Abstract):

Modern accelerator-based light sources rely on short bunches to generate intense photon pulses. To achieve this, the electron bunches from the accelerator need to be compressed longitudinally in a magnetic chicane. A valuable tool for the measurement of the signal in the bunch compressor is the use of broadband EM-detectors covering a spectral range from few 100 GHz up to THz frequencies. With this setup, bunch length variations caused by instabilities in the acceleration process can be measured that in turn also affects the secondary photon beam. In this paper, we demonstrate the pre-commissioning of broadband, room temperature Schottky THz detectors for the diagnosis of compressed short electron bunches at the TELBE facilities at the Helmholtz-Zentrum Dresden-Rossendorf, Germany. Qualitative bunch compression measurements have been carried out to diagnose the beam to optimize the machine setup and provide feedback to the beam-line scientists for optimum machine operation. These detectors are scheduled to be commissioned at free-electron facilities in near-future.

Status: Verlagsversion
URN: urn:nbn:de:tuda-tuprints-286548
Sachgruppe der Dewey Dezimalklassifikatin (DDC): 500 Naturwissenschaften und Mathematik > 530 Physik
600 Technik, Medizin, angewandte Wissenschaften > 621.3 Elektrotechnik, Elektronik
Fachbereich(e)/-gebiet(e): 18 Fachbereich Elektrotechnik und Informationstechnik
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP)
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > THz Bauelemente und THz Systeme
Hinterlegungsdatum: 09 Jan 2025 13:28
Letzte Änderung: 15 Jan 2025 13:31
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