Andersen, Mia ; Pivak, Yevheniy ; Papadimitriou, Vasilis ; Jiang, Tianshu ; Roddatis, Vladimir ; Molina-Luna, Leopoldo ; Conroy, Michele (2024)
Atomically stable cryogenic in situ biasing (S)TEM holder with precise temperature control over a wide range of temperatures.
In: Microscopy and Microanalysis, 30 (Suppl. 1)
doi: 10.1093/mam/ozae044.687
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Cryo scanning transmission electron microscopy (STEM) is becoming an indispensable tool for studying phase transitions in various quantum materials [1-3] at the atomic scale. A detailed characterization of a sample’s structural and electronic properties across phase transitions necessitates a sample holder with double tilt capability and a continuous temperature control of the specimen while maintaining a sample stability that enables atomic resolution imaging. Temperature control is achieved using microelectromechanical systems (MEMS)-based heating and biasing chips [4, 5] in combination with a dedicated cryo TEM sample holder.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2024 |
| Autor(en): | Andersen, Mia ; Pivak, Yevheniy ; Papadimitriou, Vasilis ; Jiang, Tianshu ; Roddatis, Vladimir ; Molina-Luna, Leopoldo ; Conroy, Michele |
| Art des Eintrags: | Bibliographie |
| Titel: | Atomically stable cryogenic in situ biasing (S)TEM holder with precise temperature control over a wide range of temperatures |
| Sprache: | Englisch |
| Publikationsjahr: | 24 Juli 2024 |
| Verlag: | Oxford University Press |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Microscopy and Microanalysis |
| Jahrgang/Volume einer Zeitschrift: | 30 |
| (Heft-)Nummer: | Suppl. 1 |
| DOI: | 10.1093/mam/ozae044.687 |
| Kurzbeschreibung (Abstract): | Cryo scanning transmission electron microscopy (STEM) is becoming an indispensable tool for studying phase transitions in various quantum materials [1-3] at the atomic scale. A detailed characterization of a sample’s structural and electronic properties across phase transitions necessitates a sample holder with double tilt capability and a continuous temperature control of the specimen while maintaining a sample stability that enables atomic resolution imaging. Temperature control is achieved using microelectromechanical systems (MEMS)-based heating and biasing chips [4, 5] in combination with a dedicated cryo TEM sample holder. |
| Zusätzliche Informationen: | Physical Sciences Symposia: Advanced Imaging and Spectroscopy Beyond Room Temperature |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Elektronenmikroskopie |
| Hinterlegungsdatum: | 31 Jul 2024 06:46 |
| Letzte Änderung: | 31 Jul 2024 06:46 |
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