Huang, Xiaohui ; Tang, Yushu ; Kübel, Christian ; Wang, Di (2022)
Precisely picking nanoparticles by a “nano-scalpel” for 360° electron tomography.
In: Microscopy and Microanalysis, 28 (6)
doi: 10.1017/S1431927622012247
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Electron tomography (ET) has gained increasing attention for the 3D characterization of nanoparticles. However, the missing wedge problem due to a limited tilt angle range is still the main challenge for accurate reconstruction in most experimental TEM setups. Advanced algorithms could in-paint or compensate to some extent the missing wedge artifacts, but cannot recover the missing structural information completely. 360 degrees ET provides an option to solve this problem by tilting a needle-shaped specimen over the full tilt range and thus filling the missing information. However, sample preparation especially for fine powders to perform full-range ET is still challenging, thus limiting its application. In this work, we propose a new universal sample preparation method that enables the transfer of selected individual nanoparticle or a few separated nanoparticles by cutting a piece of carbon film supporting the specimen particles and mounting them onto the full-range tomography holder tip with the help of an easily prepared sharp tungsten tip. This method is demonstrated by 360 degrees ET of Pt@TiO2 hollow cage catalyst showing high quality reconstruction without missing wedge.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2022 |
| Autor(en): | Huang, Xiaohui ; Tang, Yushu ; Kübel, Christian ; Wang, Di |
| Art des Eintrags: | Bibliographie |
| Titel: | Precisely picking nanoparticles by a “nano-scalpel” for 360° electron tomography |
| Sprache: | Englisch |
| Publikationsjahr: | Dezember 2022 |
| Verlag: | Oxford University Press |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Microscopy and Microanalysis |
| Jahrgang/Volume einer Zeitschrift: | 28 |
| (Heft-)Nummer: | 6 |
| DOI: | 10.1017/S1431927622012247 |
| Kurzbeschreibung (Abstract): | Electron tomography (ET) has gained increasing attention for the 3D characterization of nanoparticles. However, the missing wedge problem due to a limited tilt angle range is still the main challenge for accurate reconstruction in most experimental TEM setups. Advanced algorithms could in-paint or compensate to some extent the missing wedge artifacts, but cannot recover the missing structural information completely. 360 degrees ET provides an option to solve this problem by tilting a needle-shaped specimen over the full tilt range and thus filling the missing information. However, sample preparation especially for fine powders to perform full-range ET is still challenging, thus limiting its application. In this work, we propose a new universal sample preparation method that enables the transfer of selected individual nanoparticle or a few separated nanoparticles by cutting a piece of carbon film supporting the specimen particles and mounting them onto the full-range tomography holder tip with the help of an easily prepared sharp tungsten tip. This method is demonstrated by 360 degrees ET of Pt@TiO2 hollow cage catalyst showing high quality reconstruction without missing wedge. |
| Freie Schlagworte: | 360 degrees tilting, electron tomography, FIB, missing wedge, nanoparticles, sample preparation |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > In-Situ Elektronenmikroskopie |
| Hinterlegungsdatum: | 12 Jun 2024 08:54 |
| Letzte Änderung: | 12 Jun 2024 08:54 |
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