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Nanowire facilitated transfer of sensitive TEM samples in a FIB

Gorji, Saleh ; Kashiwar, Ankush ; Mantha, Lakshmi S. ; Kruk, Robert ; Witte, Ralf ; Marek, Peter ; Hahn, Horst ; Kübel, Christian ; Scherer, Torsten (2020)
Nanowire facilitated transfer of sensitive TEM samples in a FIB.
In: Ultramicroscopy, 219
doi: 10.1016/j.ultramic.2020.113075
Artikel, Bibliographie

Kurzbeschreibung (Abstract)

We introduce a facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible freestanding Ag nanowire attached to the tip of a typical tungsten micromanipulator inside the FIB. The main advantages of this approach are the significantly reduced stress-induced bending during transfer and attachment of the TEM sample, the very short time required to attach and cut the nanowire, the operation at very low dose and ion current, and only using the e-beam for Pt deposition during the transfer of sensitive TEM samples. This results in a reduced sample preparation time and reduced exposure to the ion beam or e-beam for Pt deposition during the sample preparation and thus also reduced contamination and beam damage. The method was applied to a number of thin films and different TEM samples in order to illustrate the advantageous benefits of the concept. In particular, the technique has been successfully tested for the transfer of a thin film onto a MEMS heating chip for in situ TEM experiments.

Typ des Eintrags: Artikel
Erschienen: 2020
Autor(en): Gorji, Saleh ; Kashiwar, Ankush ; Mantha, Lakshmi S. ; Kruk, Robert ; Witte, Ralf ; Marek, Peter ; Hahn, Horst ; Kübel, Christian ; Scherer, Torsten
Art des Eintrags: Bibliographie
Titel: Nanowire facilitated transfer of sensitive TEM samples in a FIB
Sprache: Englisch
Publikationsjahr: Dezember 2020
Verlag: Elsevier
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Ultramicroscopy
Jahrgang/Volume einer Zeitschrift: 219
DOI: 10.1016/j.ultramic.2020.113075
Kurzbeschreibung (Abstract):

We introduce a facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible freestanding Ag nanowire attached to the tip of a typical tungsten micromanipulator inside the FIB. The main advantages of this approach are the significantly reduced stress-induced bending during transfer and attachment of the TEM sample, the very short time required to attach and cut the nanowire, the operation at very low dose and ion current, and only using the e-beam for Pt deposition during the transfer of sensitive TEM samples. This results in a reduced sample preparation time and reduced exposure to the ion beam or e-beam for Pt deposition during the sample preparation and thus also reduced contamination and beam damage. The method was applied to a number of thin films and different TEM samples in order to illustrate the advantageous benefits of the concept. In particular, the technique has been successfully tested for the transfer of a thin film onto a MEMS heating chip for in situ TEM experiments.

Freie Schlagworte: TEM sample preparation, nanomanipulator, focused ion beam, thin film transfer, Lamellae lift-out, FeRh
ID-Nummer: Artikel-ID: 113075
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > In-Situ Elektronenmikroskopie
Hinterlegungsdatum: 12 Jun 2024 07:57
Letzte Änderung: 12 Jun 2024 07:57
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