Ebert, Martin ; Mair, V. ; Tessadri, R. ; Hoffmann, P. ; Ortner, H. M. (2000)
Total-reflection X-ray fluorescence analysis of geological microsamples.
In: Spectrochimica Acta Part B: Atomic Spectroscopy, 55 (3)
doi: 10.1016/S0584-8547(99)00178-0
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
The major and minor components of single inclusion-free crystals with diameters of approximately 1 mm of a naturally occurring garnet were quantitatively determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solutions were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor components are in good agreement. The accuracy and precision of the applied methods were checked by an additional investigation of certified corundum and basaltic reference materials. The results of this preliminary work show that the combination of a suitable decomposition technique followed by TXRF measurement is an accurate tool for the chemical characterisation of mineralogical and geological microsamples.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2000 |
Autor(en): | Ebert, Martin ; Mair, V. ; Tessadri, R. ; Hoffmann, P. ; Ortner, H. M. |
Art des Eintrags: | Bibliographie |
Titel: | Total-reflection X-ray fluorescence analysis of geological microsamples |
Sprache: | Englisch |
Publikationsjahr: | März 2000 |
Verlag: | Elsevier |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Spectrochimica Acta Part B: Atomic Spectroscopy |
Jahrgang/Volume einer Zeitschrift: | 55 |
(Heft-)Nummer: | 3 |
DOI: | 10.1016/S0584-8547(99)00178-0 |
URL / URN: | http://www.sciencedirect.com/science/article/B6THN-3YXB2KN-1... |
Kurzbeschreibung (Abstract): | The major and minor components of single inclusion-free crystals with diameters of approximately 1 mm of a naturally occurring garnet were quantitatively determined by use of electron microprobe analysis (EMPA) with EDX- and WDX-spectrometry. In order to check the EMPA-results single garnet crystals were separated mechanically, decomposed chemically and the sample solutions were investigated by total-reflection X-ray fluorescence analysis (TXRF). Results obtained by TXRF as well as by EMPA of the major and minor components are in good agreement. The accuracy and precision of the applied methods were checked by an additional investigation of certified corundum and basaltic reference materials. The results of this preliminary work show that the combination of a suitable decomposition technique followed by TXRF measurement is an accurate tool for the chemical characterisation of mineralogical and geological microsamples. |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Geowissenschaften > Fachgebiet Umweltmineralogie 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik |
Hinterlegungsdatum: | 19 Nov 2008 16:24 |
Letzte Änderung: | 26 Apr 2021 14:26 |
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