Stem, William D. ; Boine-Frankenheim, Oliver (2017)
Pushing the space charge limit: electron lenses in high-intensity synchrotrons?
In: Journal of Physics: Conference Series, 874 (1)
doi: 10.1088/1742-6596/874/1/012064
Artikel, Bibliographie
Dies ist die neueste Version dieses Eintrags.
Kurzbeschreibung (Abstract)
Several accelerator projects require an increase in the number of particles per bunch, which is constrained by the space charge limit. Above this limit the transverse space charge force in combination with the lattice structure causes beam quality degradation and beam loss. Proposed devices to mitigate this beam loss in ion beams are electron lenses. An electron lens imparts a nonlinear, localized focusing kick to counteract the (global) space-charge forces in the primary beam. This effort is met with many challenges, including a reduced dynamic aperture (DA), resonance crossing, and beam-beam alignment. This contribution provides a detailed study of idealized electron lens use in high-intensity particle accelerators, including a comparison between analytical calculations and pyORBIT particle-in-cell (PIC) simulations.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2017 |
| Autor(en): | Stem, William D. ; Boine-Frankenheim, Oliver |
| Art des Eintrags: | Bibliographie |
| Titel: | Pushing the space charge limit: electron lenses in high-intensity synchrotrons? |
| Sprache: | Englisch |
| Publikationsjahr: | 2017 |
| Ort: | Bristol |
| Verlag: | IOP Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Physics: Conference Series |
| Jahrgang/Volume einer Zeitschrift: | 874 |
| (Heft-)Nummer: | 1 |
| Kollation: | 6 Seiten |
| DOI: | 10.1088/1742-6596/874/1/012064 |
| Zugehörige Links: | |
| Kurzbeschreibung (Abstract): | Several accelerator projects require an increase in the number of particles per bunch, which is constrained by the space charge limit. Above this limit the transverse space charge force in combination with the lattice structure causes beam quality degradation and beam loss. Proposed devices to mitigate this beam loss in ion beams are electron lenses. An electron lens imparts a nonlinear, localized focusing kick to counteract the (global) space-charge forces in the primary beam. This effort is met with many challenges, including a reduced dynamic aperture (DA), resonance crossing, and beam-beam alignment. This contribution provides a detailed study of idealized electron lens use in high-intensity particle accelerators, including a comparison between analytical calculations and pyORBIT particle-in-cell (PIC) simulations. |
| ID-Nummer: | Artikel-ID: 012064 |
| Zusätzliche Informationen: | 8th International Particle Accelerator Conference 14–19 May 2017, Copenhagen, Denmark |
| Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 500 Naturwissenschaften und Mathematik > 530 Physik |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Teilchenbeschleunigung und Theorie Elektromagnetische Felder |
| Hinterlegungsdatum: | 13 Mai 2024 07:55 |
| Letzte Änderung: | 13 Mai 2024 07:55 |
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| Suche nach Titel in: | TUfind oder in Google |
Verfügbare Versionen dieses Eintrags
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Pushing the space charge limit: electron lenses in high-intensity synchrotrons? (deposited 07 Mai 2024 13:45)
- Pushing the space charge limit: electron lenses in high-intensity synchrotrons? (deposited 13 Mai 2024 07:55) [Gegenwärtig angezeigt]
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