Cottre, Thorsten ; Fingerle, Mathias ; Kranz, Melanie ; Mayer, Thomas ; Kaiser, Bernhard ; Jaegermann, Wolfram (2021)
Interaction of water with atomic layer deposited titanium dioxide on p‐Si photocathode: modeling of photoelectrochemical interfaces in ultrahigh vacuum with cryo‐photoelectron spectroscopy.
In: Advanced Materials Interfaces, 8 (11)
doi: 10.1002/admi.202002257
Artikel, Bibliographie
Dies ist die neueste Version dieses Eintrags.
Kurzbeschreibung (Abstract)
This study combines cryo‐photoelectron spectroscopy and electrochemical analysis techniques to investigate the p‐Si/SiO₂/TiO₂/H₂O system in the context of water‐splitting. Atomic layer deposition is used for the preparation of a TiO₂ thin film coating for a p‐Si/SiO₂ photocathode. First, an interface experiment is performed to study the contact properties of the interface between p‐Si/SiO₂ and TiO₂. For the p‐Si/TiO₂ heterojunction, a downward band bending of 0.3 eV is found for the p‐Si toward the interface. Second, a water adsorption experiment is conducted, which allows the investigation of the surface chemistry of the TiO₂ coating in contact to water. A direct correlation between the amount of surface hydroxide species, formed due to water dissociation, and Ti³⁺ defect state density is found. Furthermore, a surface water species can be identified in addition to the commonly found bulk molecular water. Together with the results from a Mott–Schottky analysis, a complete energy level alignment can be constructed.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2021 |
| Autor(en): | Cottre, Thorsten ; Fingerle, Mathias ; Kranz, Melanie ; Mayer, Thomas ; Kaiser, Bernhard ; Jaegermann, Wolfram |
| Art des Eintrags: | Bibliographie |
| Titel: | Interaction of water with atomic layer deposited titanium dioxide on p‐Si photocathode: modeling of photoelectrochemical interfaces in ultrahigh vacuum with cryo‐photoelectron spectroscopy |
| Sprache: | Englisch |
| Publikationsjahr: | 2021 |
| Ort: | Weinheim |
| Verlag: | Wiley-VCH |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Advanced Materials Interfaces |
| Jahrgang/Volume einer Zeitschrift: | 8 |
| (Heft-)Nummer: | 11 |
| Kollation: | 11 Seiten |
| DOI: | 10.1002/admi.202002257 |
| Zugehörige Links: | |
| Kurzbeschreibung (Abstract): | This study combines cryo‐photoelectron spectroscopy and electrochemical analysis techniques to investigate the p‐Si/SiO₂/TiO₂/H₂O system in the context of water‐splitting. Atomic layer deposition is used for the preparation of a TiO₂ thin film coating for a p‐Si/SiO₂ photocathode. First, an interface experiment is performed to study the contact properties of the interface between p‐Si/SiO₂ and TiO₂. For the p‐Si/TiO₂ heterojunction, a downward band bending of 0.3 eV is found for the p‐Si toward the interface. Second, a water adsorption experiment is conducted, which allows the investigation of the surface chemistry of the TiO₂ coating in contact to water. A direct correlation between the amount of surface hydroxide species, formed due to water dissociation, and Ti³⁺ defect state density is found. Furthermore, a surface water species can be identified in addition to the commonly found bulk molecular water. Together with the results from a Mott–Schottky analysis, a complete energy level alignment can be constructed. |
| Freie Schlagworte: | atomic layer deposition, energy band diagrams, photoelectron spectroscopy, water adsorption |
| ID-Nummer: | Artikel-ID: 2002257 |
| Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 500 Naturwissenschaften und Mathematik > 540 Chemie 600 Technik, Medizin, angewandte Wissenschaften > 660 Technische Chemie |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Oberflächenforschung |
| Hinterlegungsdatum: | 14 Feb 2024 08:05 |
| Letzte Änderung: | 14 Feb 2024 08:05 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
Verfügbare Versionen dieses Eintrags
-
Interaction of Water with Atomic Layer Deposited Titanium Dioxide on p‐Si Photocathode: Modeling of Photoelectrochemical Interfaces in Ultrahigh Vacuum with Cryo‐Photoelectron Spectroscopy. (deposited 13 Feb 2024 10:36)
- Interaction of water with atomic layer deposited titanium dioxide on p‐Si photocathode: modeling of photoelectrochemical interfaces in ultrahigh vacuum with cryo‐photoelectron spectroscopy. (deposited 14 Feb 2024 08:05) [Gegenwärtig angezeigt]
 |
Frage zum Eintrag |
Optionen (nur für Redakteure)
 |
Redaktionelle Details anzeigen |
Drucken
Impressum