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High surface stability of magnetite on bi-layer Fe₃O₄/Fe/MgO(0 0 1) films under 1 MeV Kr⁺ ion irradiation

Kim-Ngan, N.-T. H. ; Krupska, M. ; Balogh, A. G. ; Malinsky, P. ; Mackova, A. (2024)
High surface stability of magnetite on bi-layer Fe₃O₄/Fe/MgO(0 0 1) films under 1 MeV Kr⁺ ion irradiation.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 2017, 8 (4)
doi: 10.26083/tuprints-00020374
Artikel, Zweitveröffentlichung, Verlagsversion

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Kurzbeschreibung (Abstract)

We investigate the stability of the bi-layer Fe₃O₄/Fe/MgO(0 0 1) films grown epitaxially on MgO(0 0 1) substrates with the layer thickness in the range of 25–100 nm upon 1 MeV Kr⁺ ion irradiation. The layer structure and layer composition of the films before and after ion irradiation were studied by XRR, RBS and RBS-C techniques. The interdiffusion and intermixing was analyzed. No visible change in the RBS spectra was observed upon irradiation with ion fluence below 10¹⁵ Kr cm⁻². The bi-layer structure and the stoichiometric Fe₃O₄ layer on the surface were well preserved after Kr+ ion irradiation at low damage levels, although the strong intermixing implied a large interfacial (FexOy) and (Fe, Mg)Oy layer respective at Fe₃O₄–Fe and Fe–MgO interface. The high ion fluence of 3.8 × 10¹⁶ Kr cm⁻² has induced a complete oxidization of the buffer Fe layer. Under such Kr fluence, the stoichiometry of the Fe₃O₄ surface layer was still preserved indicating its high stability. The entire film contains FexOy -type composition at ion fluence large than 5.0 × 10¹⁶ Kr cm⁻².

Typ des Eintrags: Artikel
Erschienen: 2024
Autor(en): Kim-Ngan, N.-T. H. ; Krupska, M. ; Balogh, A. G. ; Malinsky, P. ; Mackova, A.
Art des Eintrags: Zweitveröffentlichung
Titel: High surface stability of magnetite on bi-layer Fe₃O₄/Fe/MgO(0 0 1) films under 1 MeV Kr⁺ ion irradiation
Sprache: Englisch
Publikationsjahr: 9 Januar 2024
Ort: Darmstadt
Publikationsdatum der Erstveröffentlichung: 2017
Ort der Erstveröffentlichung: Bristol
Verlag: IOP Publishing
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Advances in Natural Sciences: Nanoscience and Nanotechnology
Jahrgang/Volume einer Zeitschrift: 8
(Heft-)Nummer: 4
Kollation: 9 Seiten
DOI: 10.26083/tuprints-00020374
URL / URN: https://tuprints.ulb.tu-darmstadt.de/20374
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Herkunft: Zweitveröffentlichung DeepGreen
Kurzbeschreibung (Abstract):

We investigate the stability of the bi-layer Fe₃O₄/Fe/MgO(0 0 1) films grown epitaxially on MgO(0 0 1) substrates with the layer thickness in the range of 25–100 nm upon 1 MeV Kr⁺ ion irradiation. The layer structure and layer composition of the films before and after ion irradiation were studied by XRR, RBS and RBS-C techniques. The interdiffusion and intermixing was analyzed. No visible change in the RBS spectra was observed upon irradiation with ion fluence below 10¹⁵ Kr cm⁻². The bi-layer structure and the stoichiometric Fe₃O₄ layer on the surface were well preserved after Kr+ ion irradiation at low damage levels, although the strong intermixing implied a large interfacial (FexOy) and (Fe, Mg)Oy layer respective at Fe₃O₄–Fe and Fe–MgO interface. The high ion fluence of 3.8 × 10¹⁶ Kr cm⁻² has induced a complete oxidization of the buffer Fe layer. Under such Kr fluence, the stoichiometry of the Fe₃O₄ surface layer was still preserved indicating its high stability. The entire film contains FexOy -type composition at ion fluence large than 5.0 × 10¹⁶ Kr cm⁻².

Freie Schlagworte: 2.00 nanoscience, 4.10 thin film, 4.14 surface and interface
Status: Verlagsversion
URN: urn:nbn:de:tuda-tuprints-203744
Sachgruppe der Dewey Dezimalklassifikatin (DDC): 500 Naturwissenschaften und Mathematik > 530 Physik
500 Naturwissenschaften und Mathematik > 540 Chemie
600 Technik, Medizin, angewandte Wissenschaften > 660 Technische Chemie
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik
Hinterlegungsdatum: 09 Jan 2024 11:02
Letzte Änderung: 10 Jan 2024 09:50
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