Eichhorn, Anna Lisa (2023)
Multifrequency atomic force microscopy for the in-plane and out-of-plane nanomechanical characterization of graphitic surfaces.
Technische Universität Darmstadt
doi: 10.26083/tuprints-00023856
Dissertation, Erstveröffentlichung, Verlagsversion
Kurzbeschreibung (Abstract)
Graphene is considered as one of the most promising materials for numerous applications such as electronics, photonics, membranes, sensors, heat dissipators, lubricants and many more [1, 2]. In addition to its outstanding electronic properties, in particular, the extraordinary mechanical properties of graphene have become the focus of scientific attention. For example, it has been shown that defect-free graphene has an enormously high Young’s modulus of about 1 TPa [3]. However, little research has been done on the local influence of defects on the nanomechanical properties of graphene. Several challenges come to mind as possible reasons, such as (i) imaging graphene with atomic resolution, (ii) simultaneous analysis of sample properties parallel and perpendicular to the sample plane, (iii) preparation of adsorbate-free graphene samples, and (iv) targeted introduction of defects. To overcome the aforementioned challenges, first, an atomic force microscopy-based method was developed within this work that enables imaging of graphene in air under ambient conditions with atomic resolution. In addition, the method was designed to allow quantification of interaction forces, both, perpendicular and parallel to the graphene surface. This is particularly important to access the complete set of elastic constants of graphene. An important finding of this work is that different adsorbate types could be observed on the graphene surface shortly after the preparation of graphene samples. Therefore, a detailed analysis of the adsorbates was performed using the developed multifrequency atomic force microscopy method. Furthermore, the extent to which oxygen-plasma treatment can be used to remove adsorbates from a graphene sample stored under laboratory air conditions was examined. Adsorbate removal is a basic requirement for the targeted introduction of defects, as well as for the investigation of their influence on the local nanomechanical properties. The effect of oxygen-plasma treatment on different graphene-/graphite-samples was additionally investigated by Raman spectroscopy.
| Typ des Eintrags: | Dissertation | ||||
|---|---|---|---|---|---|
| Erschienen: | 2023 | ||||
| Autor(en): | Eichhorn, Anna Lisa | ||||
| Art des Eintrags: | Erstveröffentlichung | ||||
| Titel: | Multifrequency atomic force microscopy for the in-plane and out-of-plane nanomechanical characterization of graphitic surfaces | ||||
| Sprache: | Englisch | ||||
| Referenten: | Dietz, PD Dr. Christian ; Klitzing, Prof. Dr. Regine von | ||||
| Publikationsjahr: | 2023 | ||||
| Ort: | Darmstadt | ||||
| Kollation: | VIII, 185 Seiten | ||||
| Datum der mündlichen Prüfung: | 5 Mai 2023 | ||||
| DOI: | 10.26083/tuprints-00023856 | ||||
| URL / URN: | https://tuprints.ulb.tu-darmstadt.de/23856 | ||||
| Kurzbeschreibung (Abstract): | Graphene is considered as one of the most promising materials for numerous applications such as electronics, photonics, membranes, sensors, heat dissipators, lubricants and many more [1, 2]. In addition to its outstanding electronic properties, in particular, the extraordinary mechanical properties of graphene have become the focus of scientific attention. For example, it has been shown that defect-free graphene has an enormously high Young’s modulus of about 1 TPa [3]. However, little research has been done on the local influence of defects on the nanomechanical properties of graphene. Several challenges come to mind as possible reasons, such as (i) imaging graphene with atomic resolution, (ii) simultaneous analysis of sample properties parallel and perpendicular to the sample plane, (iii) preparation of adsorbate-free graphene samples, and (iv) targeted introduction of defects. To overcome the aforementioned challenges, first, an atomic force microscopy-based method was developed within this work that enables imaging of graphene in air under ambient conditions with atomic resolution. In addition, the method was designed to allow quantification of interaction forces, both, perpendicular and parallel to the graphene surface. This is particularly important to access the complete set of elastic constants of graphene. An important finding of this work is that different adsorbate types could be observed on the graphene surface shortly after the preparation of graphene samples. Therefore, a detailed analysis of the adsorbates was performed using the developed multifrequency atomic force microscopy method. Furthermore, the extent to which oxygen-plasma treatment can be used to remove adsorbates from a graphene sample stored under laboratory air conditions was examined. Adsorbate removal is a basic requirement for the targeted introduction of defects, as well as for the investigation of their influence on the local nanomechanical properties. The effect of oxygen-plasma treatment on different graphene-/graphite-samples was additionally investigated by Raman spectroscopy. |
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| Alternatives oder übersetztes Abstract: |
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| Status: | Verlagsversion | ||||
| URN: | urn:nbn:de:tuda-tuprints-238563 | ||||
| Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 500 Naturwissenschaften und Mathematik > 500 Naturwissenschaften 500 Naturwissenschaften und Mathematik > 530 Physik 500 Naturwissenschaften und Mathematik > 540 Chemie |
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| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Physics of Surfaces |
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| Hinterlegungsdatum: | 05 Jul 2023 12:02 | ||||
| Letzte Änderung: | 06 Jul 2023 05:28 | ||||
| PPN: | |||||
| Referenten: | Dietz, PD Dr. Christian ; Klitzing, Prof. Dr. Regine von | ||||
| Datum der mündlichen Prüfung / Verteidigung / mdl. Prüfung: | 5 Mai 2023 | ||||
| Export: | |||||
| Suche nach Titel in: | TUfind oder in Google | ||||
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