Keil, Ferdinand (2023)
Accelerated Lifetime Testing of Off-Line LED Drivers.
Technische Universität Darmstadt
doi: 10.26083/tuprints-00023782
Dissertation, Erstveröffentlichung, Verlagsversion
Kurzbeschreibung (Abstract)
It took just ten years for LEDs to become the most successful lighting technology by market share. Their high energy efficiency and long lifetime make them the first choice in many lighting applications. However, failures of LED based luminaires can still be observed. If public lighting installations such as street lights fail it can even make the news. Previous research has shown that the driver is the culprit in most of these cases. This work tries to answer how long modern drivers can survive in a given environmental condition, which external factors and driver properties affect the lifetime and what the lifetime limiting failure modes are.
An accelerated lifetime study with a total of 75 tested devices is conducted and its results are analysed. Four different environmental conditions are selected for the tests, namely dry heat at 85 °C and damp heat at 65 °C and 90 % relative humidity as well as 75 °C / 75 % and 85 °C / 85 %. During testing 39 failures are observed. A first analysis focuses on the degradation of aluminium electrolytic capacitors in dry heat. It can be shown that the parametric changes are negligible. This is followed by a forensic failure mode analysis that successfully uncovers the failure modes of 27 failed devices. Dielectric breakdown of the PCB and IC package defects are determined to be the most common failure causes. It is also demonstrated that MOVs are at risk of failing in certain circuit configurations.
Two physical accelerated failure time models get fitted for three drivers with complete datasets. Plotting the resulting lifetime model for a range of temperature/humidity combinations shows that these drivers will likely outlast the lifetime guaranteed by the manufacturer in their respective data sheets. An extension is proposed to apply the models to three drivers whose datasets contain right-censored values. It can be demonstrated that these drivers will meet the guaranteed lifetime as well. The Cox Proportional Hazards model, a model from the field of survival analysis, is applied to the data from the 85 °C / 85 % condition to identify driver properties that affect the lifetime. The three best fitting models are selected and their parameters are whether a driver's output current is programmable, its maximum output power in Watt and which PCB substrate was used for the circuit assembly. Based on the previous results a list of recommendations for future off-line driver designs is compiled.
In conclusion, this work demonstrates that modern off-line LED drivers can reach the manufacturer specified lifetimes based on the results of the accelerated life study. Drivers fail if subjected to high levels of humidity. Choosing FR-4 as the PCB substrate can significantly lower a driver's risk of failure. If it fails, the most common failure modes are dielectric breakdown of the PCB and a defect of an IC package.
Typ des Eintrags: | Dissertation | ||||
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Erschienen: | 2023 | ||||
Autor(en): | Keil, Ferdinand | ||||
Art des Eintrags: | Erstveröffentlichung | ||||
Titel: | Accelerated Lifetime Testing of Off-Line LED Drivers | ||||
Sprache: | Englisch | ||||
Referenten: | Hofmann, Prof. Dr. Klaus ; Khanh, Prof. Dr. Tran Quoc | ||||
Publikationsjahr: | 2023 | ||||
Ort: | Darmstadt | ||||
Kollation: | xxii, 99 Seiten | ||||
Datum der mündlichen Prüfung: | 16 November 2022 | ||||
DOI: | 10.26083/tuprints-00023782 | ||||
URL / URN: | https://tuprints.ulb.tu-darmstadt.de/23782 | ||||
Kurzbeschreibung (Abstract): | It took just ten years for LEDs to become the most successful lighting technology by market share. Their high energy efficiency and long lifetime make them the first choice in many lighting applications. However, failures of LED based luminaires can still be observed. If public lighting installations such as street lights fail it can even make the news. Previous research has shown that the driver is the culprit in most of these cases. This work tries to answer how long modern drivers can survive in a given environmental condition, which external factors and driver properties affect the lifetime and what the lifetime limiting failure modes are. An accelerated lifetime study with a total of 75 tested devices is conducted and its results are analysed. Four different environmental conditions are selected for the tests, namely dry heat at 85 °C and damp heat at 65 °C and 90 % relative humidity as well as 75 °C / 75 % and 85 °C / 85 %. During testing 39 failures are observed. A first analysis focuses on the degradation of aluminium electrolytic capacitors in dry heat. It can be shown that the parametric changes are negligible. This is followed by a forensic failure mode analysis that successfully uncovers the failure modes of 27 failed devices. Dielectric breakdown of the PCB and IC package defects are determined to be the most common failure causes. It is also demonstrated that MOVs are at risk of failing in certain circuit configurations. Two physical accelerated failure time models get fitted for three drivers with complete datasets. Plotting the resulting lifetime model for a range of temperature/humidity combinations shows that these drivers will likely outlast the lifetime guaranteed by the manufacturer in their respective data sheets. An extension is proposed to apply the models to three drivers whose datasets contain right-censored values. It can be demonstrated that these drivers will meet the guaranteed lifetime as well. The Cox Proportional Hazards model, a model from the field of survival analysis, is applied to the data from the 85 °C / 85 % condition to identify driver properties that affect the lifetime. The three best fitting models are selected and their parameters are whether a driver's output current is programmable, its maximum output power in Watt and which PCB substrate was used for the circuit assembly. Based on the previous results a list of recommendations for future off-line driver designs is compiled. In conclusion, this work demonstrates that modern off-line LED drivers can reach the manufacturer specified lifetimes based on the results of the accelerated life study. Drivers fail if subjected to high levels of humidity. Choosing FR-4 as the PCB substrate can significantly lower a driver's risk of failure. If it fails, the most common failure modes are dielectric breakdown of the PCB and a defect of an IC package. |
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Status: | Verlagsversion | ||||
URN: | urn:nbn:de:tuda-tuprints-237821 | ||||
Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften und Maschinenbau | ||||
Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Datentechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Datentechnik > Integrierte Elektronische Systeme (IES) |
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Hinterlegungsdatum: | 31 Mai 2023 11:47 | ||||
Letzte Änderung: | 06 Jun 2023 09:04 | ||||
PPN: | |||||
Referenten: | Hofmann, Prof. Dr. Klaus ; Khanh, Prof. Dr. Tran Quoc | ||||
Datum der mündlichen Prüfung / Verteidigung / mdl. Prüfung: | 16 November 2022 | ||||
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