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State-of-the-Art Room Temperature Operable Zero-Bias Schottky Diode-Based Terahertz Detector Up to 5.56 THz

Yadav, Rahul ; Ludwig, Florian ; Faridi, Fahd Rushd ; Klopf, J. Michael ; Roskos, Hartmut G. ; Preu, Sascha ; Penirschke, Andreas (2023)
State-of-the-Art Room Temperature Operable Zero-Bias Schottky Diode-Based Terahertz Detector Up to 5.56 THz.
In: Sensors, 2023, 23 (7)
doi: 10.26083/tuprints-00023647
Artikel, Zweitveröffentlichung, Verlagsversion

Kurzbeschreibung (Abstract)

We present the characterization of a Zero-bias Schottky diode-based Terahertz (THz) detector up to 5.56 THz. The detector was operated with both a table-top system until 1.2 THz and at a Free-Electron Laser (FEL) facility at singular frequencies from 1.9 to 5.56 THz. We used two measurement techniques in order to discriminate the sub-ns-scale (via a 20 GHz oscilloscope) and the ms-scale (using the lock-in technique) responsivity. While the lock-in measurements basically contain all rectification effects, the sub-ns-scale detection with the oscilloscope is not sensitive to slow bolometric effects caused by changes of the IV characteristic due to temperature. The noise equivalent power (NEP) is 10 pW/Hz in the frequency range from 0.2 to 0.6 THz and 17 pW/Hz at 1.2 THz and increases to 0.9 μW/Hz at 5.56 THz, which is at the state of the art for room temperature zero-bias Schottky diode-based THz detectors with non-resonant antennas. The voltage and current responsivity of ∼500 kV/W and ∼100 mA/W, respectively, is demonstrated over a frequency range of 0.2 to 1.2 THz with the table-top system.

Typ des Eintrags: Artikel
Erschienen: 2023
Autor(en): Yadav, Rahul ; Ludwig, Florian ; Faridi, Fahd Rushd ; Klopf, J. Michael ; Roskos, Hartmut G. ; Preu, Sascha ; Penirschke, Andreas
Art des Eintrags: Zweitveröffentlichung
Titel: State-of-the-Art Room Temperature Operable Zero-Bias Schottky Diode-Based Terahertz Detector Up to 5.56 THz
Sprache: Englisch
Publikationsjahr: 2023
Ort: Darmstadt
Publikationsdatum der Erstveröffentlichung: 2023
Verlag: MDPI
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Sensors
Jahrgang/Volume einer Zeitschrift: 23
(Heft-)Nummer: 7
Kollation: 12 Seiten
DOI: 10.26083/tuprints-00023647
URL / URN: https://tuprints.ulb.tu-darmstadt.de/23647
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Herkunft: Zweitveröffentlichung DeepGreen
Kurzbeschreibung (Abstract):

We present the characterization of a Zero-bias Schottky diode-based Terahertz (THz) detector up to 5.56 THz. The detector was operated with both a table-top system until 1.2 THz and at a Free-Electron Laser (FEL) facility at singular frequencies from 1.9 to 5.56 THz. We used two measurement techniques in order to discriminate the sub-ns-scale (via a 20 GHz oscilloscope) and the ms-scale (using the lock-in technique) responsivity. While the lock-in measurements basically contain all rectification effects, the sub-ns-scale detection with the oscilloscope is not sensitive to slow bolometric effects caused by changes of the IV characteristic due to temperature. The noise equivalent power (NEP) is 10 pW/Hz in the frequency range from 0.2 to 0.6 THz and 17 pW/Hz at 1.2 THz and increases to 0.9 μW/Hz at 5.56 THz, which is at the state of the art for room temperature zero-bias Schottky diode-based THz detectors with non-resonant antennas. The voltage and current responsivity of ∼500 kV/W and ∼100 mA/W, respectively, is demonstrated over a frequency range of 0.2 to 1.2 THz with the table-top system.

Freie Schlagworte: free-electron laser (FEL), broadband detectors, THz sources, THz radiation detectors, zero-bias Schottky diode, room temperature detectors
Status: Verlagsversion
URN: urn:nbn:de:tuda-tuprints-236478
Zusätzliche Informationen:

This article belongs to the Special Issue Superconductor and Semiconductor-Based Radiation Detectors

Sachgruppe der Dewey Dezimalklassifikatin (DDC): 500 Naturwissenschaften und Mathematik > 530 Physik
600 Technik, Medizin, angewandte Wissenschaften > 620 Ingenieurwissenschaften und Maschinenbau
Fachbereich(e)/-gebiet(e): 18 Fachbereich Elektrotechnik und Informationstechnik
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP)
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > THz Bauelemente und THz Systeme
Hinterlegungsdatum: 11 Apr 2023 11:44
Letzte Änderung: 13 Apr 2023 14:41
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