Cakara, Dusko ; Ritzert, Philipp ; Boyaciyan, Dikran ; Klitzing, Regine von (2022)
Dielectric function of a polymer brush functionalized with gold nanoparticles determined from spectroscopic ellipsometry.
45th Jubilee International Convention on Information, Communication and Electronic Technology. Opatija, Croatia (23.-27.05.2022)
doi: 10.23919/MIPRO55190.2022.9803571
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
Spectroscopic ellipsometry is a powerful technique for measuring the thickness and dielectric function of thin films deposited upon optically reflective surfaces. The dielectric function determines the material optoelectronic properties, however its ellipsometric measurement is challenging in cases when the film thickness and its exact structure in terms of phases and their optical properties, are unknown. The present paper discusses several models of film dielectric function, which may be considered for fitting the ellipsometric spectra of a poly(N-ispropylacrylamide) brush grown at silicon surface and functionalized with gold nanoparticles.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2022 |
| Autor(en): | Cakara, Dusko ; Ritzert, Philipp ; Boyaciyan, Dikran ; Klitzing, Regine von |
| Art des Eintrags: | Bibliographie |
| Titel: | Dielectric function of a polymer brush functionalized with gold nanoparticles determined from spectroscopic ellipsometry |
| Sprache: | Englisch |
| Publikationsjahr: | 27 Juni 2022 |
| Verlag: | IEEE |
| Buchtitel: | 2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO): Proceedings |
| Veranstaltungstitel: | 45th Jubilee International Convention on Information, Communication and Electronic Technology |
| Veranstaltungsort: | Opatija, Croatia |
| Veranstaltungsdatum: | 23.-27.05.2022 |
| DOI: | 10.23919/MIPRO55190.2022.9803571 |
| URL / URN: | https://ieeexplore.ieee.org/document/9803571 |
| Kurzbeschreibung (Abstract): | Spectroscopic ellipsometry is a powerful technique for measuring the thickness and dielectric function of thin films deposited upon optically reflective surfaces. The dielectric function determines the material optoelectronic properties, however its ellipsometric measurement is challenging in cases when the film thickness and its exact structure in terms of phases and their optical properties, are unknown. The present paper discusses several models of film dielectric function, which may be considered for fitting the ellipsometric spectra of a poly(N-ispropylacrylamide) brush grown at silicon surface and functionalized with gold nanoparticles. |
| Fachbereich(e)/-gebiet(e): | 05 Fachbereich Physik 05 Fachbereich Physik > Institut für Festkörperphysik (2021 umbenannt in Institut für Physik Kondensierter Materie (IPKM)) |
| Hinterlegungsdatum: | 18 Jul 2022 08:36 |
| Letzte Änderung: | 18 Jul 2022 08:36 |
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