Scoppola, Ernesto ; Micciulla, Samantha ; Kuhrts, Lucas ; Maestro, Armando ; Campbell, Richard A. ; Konovalov, Oleg V. ; Fragneto, Giovanna ; Schneck, Emanuel (2022)
Reflectometry Reveals Accumulation of Surfactant Impurities at Bare Oil/Water Interfaces.
In: Molecules, 2022, 24 (22)
doi: 10.26083/tuprints-00015737
Artikel, Zweitveröffentlichung, Verlagsversion
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Kurzbeschreibung (Abstract)
Bare interfaces between water and hydrophobic media like air or oil are of fundamental scientific interest and of great relevance for numerous applications. A number of observations involving water/hydrophobic interfaces have, however, eluded a consensus mechanistic interpretation so far. Recent theoretical studies ascribe these phenomena to an interfacial accumulation of charged surfactant impurities in water. In the present work, we show that identifying surfactant accumulation with X-ray reflectometry (XRR) or neutron reflectometry (NR) is challenging under conventional contrast configurations because interfacial surfactant layers are then hardly visible. On the other hand, both XRR and NR become more sensitive to surfactant accumulation when a suitable scattering length contrast is generated by using fluorinated oil. With this approach, significant interfacial accumulation of surfactant impurities at the bare oil/water interface is observed in experiments involving standard cleaning procedures. These results suggest that surfactant impurities may be a limiting factor for the investigation of fundamental phenomena involving water/hydrophobic interfaces.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2022 |
Autor(en): | Scoppola, Ernesto ; Micciulla, Samantha ; Kuhrts, Lucas ; Maestro, Armando ; Campbell, Richard A. ; Konovalov, Oleg V. ; Fragneto, Giovanna ; Schneck, Emanuel |
Art des Eintrags: | Zweitveröffentlichung |
Titel: | Reflectometry Reveals Accumulation of Surfactant Impurities at Bare Oil/Water Interfaces |
Sprache: | Englisch |
Publikationsjahr: | 2022 |
Publikationsdatum der Erstveröffentlichung: | 2022 |
Verlag: | MDPI |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Molecules |
Jahrgang/Volume einer Zeitschrift: | 24 |
(Heft-)Nummer: | 22 |
Kollation: | 16 Seiten |
DOI: | 10.26083/tuprints-00015737 |
URL / URN: | https://tuprints.ulb.tu-darmstadt.de/15737 |
Zugehörige Links: | |
Herkunft: | Zweitveröffentlichung |
Kurzbeschreibung (Abstract): | Bare interfaces between water and hydrophobic media like air or oil are of fundamental scientific interest and of great relevance for numerous applications. A number of observations involving water/hydrophobic interfaces have, however, eluded a consensus mechanistic interpretation so far. Recent theoretical studies ascribe these phenomena to an interfacial accumulation of charged surfactant impurities in water. In the present work, we show that identifying surfactant accumulation with X-ray reflectometry (XRR) or neutron reflectometry (NR) is challenging under conventional contrast configurations because interfacial surfactant layers are then hardly visible. On the other hand, both XRR and NR become more sensitive to surfactant accumulation when a suitable scattering length contrast is generated by using fluorinated oil. With this approach, significant interfacial accumulation of surfactant impurities at the bare oil/water interface is observed in experiments involving standard cleaning procedures. These results suggest that surfactant impurities may be a limiting factor for the investigation of fundamental phenomena involving water/hydrophobic interfaces. |
Freie Schlagworte: | X-ray reflectometry, neutron reflectometry, fluorocarbons, liquid/liquid interfaces |
Status: | Verlagsversion |
URN: | urn:nbn:de:tuda-tuprints-157375 |
Sachgruppe der Dewey Dezimalklassifikatin (DDC): | 500 Naturwissenschaften und Mathematik > 530 Physik 500 Naturwissenschaften und Mathematik > 540 Chemie |
Fachbereich(e)/-gebiet(e): | 05 Fachbereich Physik 05 Fachbereich Physik > Institut für Physik Kondensierter Materie (IPKM) |
Hinterlegungsdatum: | 09 Feb 2022 15:29 |
Letzte Änderung: | 10 Feb 2022 10:26 |
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