Fritz, Katharina ; Neumann, Lukas ; Meinert, Markus (2020)
Ultralow Switching-Current Density in All-Amorphous W−Hf/Co−Fe−B/TaOx Films.
In: Physical Review Applied, 14 (3)
doi: 10.1103/PhysRevApplied.14.034047
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
We study current-induced deterministic magnetization switching and domain-wall motion via polar Kerr microscopy in all-amorphous W66Hf34/Co−Fe−B(CFB)/TaOx with perpendicular magnetic anisotropy and a large spin Hall angle. Investigations of magnetization switching as a function of the in-plane assist field and the current-pulse width yield switching-current densities as low as 3×109A/m2. We accredit this low switching-current density to a low depinning-current density, which is obtained from measurements of domain-wall displacements upon current injection. This correlation is verified by investigations of a Ta/CFB/MgO/Ta reference sample, which shows critical-current densities that are at least one order of magnitude larger.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2020 |
| Autor(en): | Fritz, Katharina ; Neumann, Lukas ; Meinert, Markus |
| Art des Eintrags: | Bibliographie |
| Titel: | Ultralow Switching-Current Density in All-Amorphous W−Hf/Co−Fe−B/TaOx Films |
| Sprache: | Englisch |
| Publikationsjahr: | 17 September 2020 |
| Verlag: | APS Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Physical Review Applied |
| Jahrgang/Volume einer Zeitschrift: | 14 |
| (Heft-)Nummer: | 3 |
| DOI: | 10.1103/PhysRevApplied.14.034047 |
| Kurzbeschreibung (Abstract): | We study current-induced deterministic magnetization switching and domain-wall motion via polar Kerr microscopy in all-amorphous W66Hf34/Co−Fe−B(CFB)/TaOx with perpendicular magnetic anisotropy and a large spin Hall angle. Investigations of magnetization switching as a function of the in-plane assist field and the current-pulse width yield switching-current densities as low as 3×109A/m2. We accredit this low switching-current density to a low depinning-current density, which is obtained from measurements of domain-wall displacements upon current injection. This correlation is verified by investigations of a Ta/CFB/MgO/Ta reference sample, which shows critical-current densities that are at least one order of magnitude larger. |
| Zusätzliche Informationen: | Art.No.: 034047 |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik (IMP) > Neue Materialien Elektronik |
| Hinterlegungsdatum: | 14 Jan 2022 10:16 |
| Letzte Änderung: | 27 Jan 2022 10:28 |
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