Mortan, Claudiu ; Hellmann, Tim ; Clemens, Oliver ; Mayer, Thomas ; Jaegermann, Wolfram (2019)
Preparation of Methylammonium Tin Iodide (CH 3 NH 3 SnI 3 ) Perovskite Thin Films via Flash Evaporation.
In: physica status solidi (a), 216 (18)
doi: 10.1002/pssa.201900209
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Using the one‐step flash evaporation technique, it is possible to deposit a film of methylammonium tin iodide (MASI, CH3NH3SnI3) from the solid perovskite powder that is prepared by a mechanochemical synthesis, without the use of any solvents. The source material and the film are characterized by X‐ray photoelectron spectroscopy (XPS) and X‐ray diffraction (XRD). The XPS measurements show that the MASI film is stoichiometric and is a p‐type material with the Fermi level of 0.4 eV above the valence band maximum (VBM) and a bandgap of 1.3 eV. The XRD pattern of the film reveals the formation of MASI perovskite of high purity, crystallizing with pseudo‐cubic symmetry, having the lattice parameters a ≈ c = 6.239(8) Å.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2019 |
Autor(en): | Mortan, Claudiu ; Hellmann, Tim ; Clemens, Oliver ; Mayer, Thomas ; Jaegermann, Wolfram |
Art des Eintrags: | Bibliographie |
Titel: | Preparation of Methylammonium Tin Iodide (CH 3 NH 3 SnI 3 ) Perovskite Thin Films via Flash Evaporation |
Sprache: | Englisch |
Publikationsjahr: | 5 Juni 2019 |
Verlag: | Wiley‐VCH |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | physica status solidi (a) |
Jahrgang/Volume einer Zeitschrift: | 216 |
(Heft-)Nummer: | 18 |
DOI: | 10.1002/pssa.201900209 |
URL / URN: | https://doi.org/10.1002/pssa.201900209 |
Kurzbeschreibung (Abstract): | Using the one‐step flash evaporation technique, it is possible to deposit a film of methylammonium tin iodide (MASI, CH3NH3SnI3) from the solid perovskite powder that is prepared by a mechanochemical synthesis, without the use of any solvents. The source material and the film are characterized by X‐ray photoelectron spectroscopy (XPS) and X‐ray diffraction (XRD). The XPS measurements show that the MASI film is stoichiometric and is a p‐type material with the Fermi level of 0.4 eV above the valence band maximum (VBM) and a bandgap of 1.3 eV. The XRD pattern of the film reveals the formation of MASI perovskite of high purity, crystallizing with pseudo‐cubic symmetry, having the lattice parameters a ≈ c = 6.239(8) Å. |
Freie Schlagworte: | flash evaporation, methylammonium tin iodide, perovskite solar cells |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialdesign durch Synthese 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Oberflächenforschung |
Hinterlegungsdatum: | 04 Jun 2020 05:50 |
Letzte Änderung: | 04 Jun 2020 05:50 |
PPN: | |
Projekte: | The authors would like to thank for the financial support of the Darmstadt Graduate School of Excellence Energy Science and Engineering, a DFG project, GSC 1070 and from the BMBF within the PeroSol project 03SF0483A. i, O.C. acknowledges support from the German Research Foundation (DFG) within CL551/2‐1. |
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