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Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer

Faridi, F. R. ; Preu, S. (2020):
Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer.
pp. 1-2, Paris, France, 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), DOI: 10.25534/tuprints-00011364,
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2020
Creators: Faridi, F. R. ; Preu, S.
Title: Characterization of a Terahertz Isolator using a 1.5 Port Vector Spectrometer
Language: English
Place of Publication: Paris, France
Uncontrolled Keywords: spectrometers;terahertz spectroscopy;terahertz isolator;reflection geometry;terahertz time domain spectroscopy;THz TDS;transmission geometry;1.5 port vector spectrometer;Isolators;Loss measurement;Insertion loss;Reflection;Frequency measurement;Time-domain analysis;Quantum cascade lasers
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Terahertz Devices and Systems
Event Title: 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
Date Deposited: 26 Jan 2020 20:57
DOI: 10.25534/tuprints-00011364
Official URL: https://tuprints.ulb.tu-darmstadt.de/11364
URN: urn:nbn:de:tuda-tuprints-113644
Additional Information:

Deutsche Forschungsgemeinschaft (DFG) funding project 278381540 (REPHCON)

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