TU Darmstadt / ULB / TUbiblio

Multirate Time-Domain Simulation of Field/Circuit Coupled Pulse-Width-Modulation Controlled Devices

Schöps, Sebastian and Sabariego, Ruth V. and Gyselinck, Johan
Guo, Lei (ed.) (2015):
Multirate Time-Domain Simulation of Field/Circuit Coupled Pulse-Width-Modulation Controlled Devices.
Beijing, China, In: 8th International Congress on Industrial and Applied Mathematics (ICIAM 2015), Beijing, China, [Online-Edition: http://www.iciam2015.cn],
[Conference or Workshop Item]

Official URL: http://www.iciam2015.cn
Item Type: Conference or Workshop Item
Erschienen: 2015
Editors: Guo, Lei
Creators: Schöps, Sebastian and Sabariego, Ruth V. and Gyselinck, Johan
Title: Multirate Time-Domain Simulation of Field/Circuit Coupled Pulse-Width-Modulation Controlled Devices
Language: English
Place of Publication: Beijing, China
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Accelerator Science and Electromagnetic Fields > Computational Electromagnetics
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields)
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) > Computational Engineering (from 01.01.2019 renamed Computational Electromagnetics)
18 Department of Electrical Engineering and Information Technology > Institute for Accelerator Science and Electromagnetic Fields
Exzellenzinitiative
Exzellenzinitiative > Graduate Schools
Exzellenzinitiative > Graduate Schools > Graduate School of Computational Engineering (CE)
Event Title: 8th International Congress on Industrial and Applied Mathematics (ICIAM 2015)
Event Location: Beijing, China
Date Deposited: 29 Jul 2019 07:30
Official URL: http://www.iciam2015.cn
Export:

Optionen (nur für Redakteure)

View Item View Item