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Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors

Noll, Dennis and Schwalke, Udo (2019):
Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors.
In: ECS Transactions, pp. 41-49, 86, (9), ISSN 1938-6737,
DOI: 10.1149/08609.0041ecst,
[Online-Edition: http://ecst.ecsdl.org/content/86/9/41.abstract?sid=1c3d40c0-...],
[Article]

Item Type: Article
Erschienen: 2019
Creators: Noll, Dennis and Schwalke, Udo
Title: Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors
Language: English
Journal or Publication Title: ECS Transactions
Volume: 86
Number: 9
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Date Deposited: 30 Jul 2019 09:27
DOI: 10.1149/08609.0041ecst
Official URL: http://ecst.ecsdl.org/content/86/9/41.abstract?sid=1c3d40c0-...
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