Walk, D. and Kienemund, D. and Zeinar, L. and Salg, P. and Radetinac, A. and Komissinskiy, P. and Alff, L. and Jakoby, R. and Maune, H. (2019):
Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors.
In: IEEE Microwave and Wireless Components Letters, pp. 213-215. DOI: 10.1109/lmwc.2019.2897901,
[Article]
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