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Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors

Walk, D. and Kienemund, D. and Zeinar, L. and Salg, P. and Radetinac, A. and Komissinskiy, P. and Alff, L. and Jakoby, R. and Maune, H. (2019):
Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors.
In: IEEE Microwave and Wireless Components Letters, pp. 213-215. DOI: 10.1109/lmwc.2019.2897901,
[Article]

Item Type: Article
Erschienen: 2019
Creators: Walk, D. and Kienemund, D. and Zeinar, L. and Salg, P. and Radetinac, A. and Komissinskiy, P. and Alff, L. and Jakoby, R. and Maune, H.
Title: Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors
Language: German
Journal or Publication Title: IEEE Microwave and Wireless Components Letters
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Date Deposited: 18 Mar 2019 07:22
DOI: 10.1109/lmwc.2019.2897901
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