Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors

Item Type:	Article
Erschienen:	2019
Creators:	Walk, D. and Kienemund, D. and Zeinar, L. and Salg, P. and Radetinac, A. and Komissinskiy, P. and Alff, L. and Jakoby, R. and Maune, H.
Title:	Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors
Language:	German
Journal or Publication Title:	IEEE Microwave and Wireless Components Letters
Divisions:	11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Date Deposited:	18 Mar 2019 07:22
DOI:	10.1109/lmwc.2019.2897901
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