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Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors

Walk, D. ; Kienemund, D. ; Zeinar, L. ; Salg, P. ; Radetinac, A. ; Komissinskiy, P. ; Alff, L. ; Jakoby, R. ; Maune, H. (2019):
Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors.
In: IEEE Microwave and Wireless Components Letters, pp. 213-215. DOI: 10.1109/lmwc.2019.2897901,
[Article]

Item Type:	Article
Erschienen:	2019
Creators:	Walk, D. ; Kienemund, D. ; Zeinar, L. ; Salg, P. ; Radetinac, A. ; Komissinskiy, P. ; Alff, L. ; Jakoby, R. ; Maune, H.
Title:	Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors
Language:	German
Journal or Publication Title:	IEEE Microwave and Wireless Components Letters
Divisions:	11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Microwave Engineering 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
Date Deposited:	18 Mar 2019 07:22
DOI:	10.1109/lmwc.2019.2897901
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