Pivak, Yevheniy ; Perez-Garza, Hector H. ; Zintler, Alexander ; Molina-Luna, Leopoldo (2017)
Electrical characterization and failure analysis using operando TEM.
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis. Pasadena, Californien, USA (05.09.2017-05.09.2017)
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
We present here the development of a system that allows for in-situ studies inside the Transmission Electron Microscope (TEM). Functionalized Microelectromechanical Systems (MEMS) used as sample carriers, referred to as Nano-Chips, contain up to eight electrodes used for simultaneous biasing and heating purposes, enabling electro-thermal characterization of various sample types inside the TEM under real life dynamic conditions. This operando approach is an ideal method to study failure analysis of semiconductor materials, performance of resistive switching devices, batteries, fuel cells, piezoceramics and many more.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2017 |
| Autor(en): | Pivak, Yevheniy ; Perez-Garza, Hector H. ; Zintler, Alexander ; Molina-Luna, Leopoldo |
| Art des Eintrags: | Bibliographie |
| Titel: | Electrical characterization and failure analysis using operando TEM |
| Sprache: | Englisch |
| Publikationsjahr: | 12 Januar 2017 |
| Verlag: | ASM INTERNATIONAL, 9503 KINSMAN RD, MATERIALS PARK, OH 44073 USA |
| Veranstaltungstitel: | ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis |
| Veranstaltungsort: | Pasadena, Californien, USA |
| Veranstaltungsdatum: | 05.09.2017-05.09.2017 |
| Kurzbeschreibung (Abstract): | We present here the development of a system that allows for in-situ studies inside the Transmission Electron Microscope (TEM). Functionalized Microelectromechanical Systems (MEMS) used as sample carriers, referred to as Nano-Chips, contain up to eight electrodes used for simultaneous biasing and heating purposes, enabling electro-thermal characterization of various sample types inside the TEM under real life dynamic conditions. This operando approach is an ideal method to study failure analysis of semiconductor materials, performance of resistive switching devices, batteries, fuel cells, piezoceramics and many more. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Elektronenmikroskopie |
| Hinterlegungsdatum: | 10 Dez 2018 10:12 |
| Letzte Änderung: | 20 Dez 2018 15:26 |
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