Long, Daniel M. ; Klein, Andreas ; Dickey, Elizabeth C. (2019)
Barrier formation at BaTiO3 interfaces with Ni and NiO.
In: Applied Surface Science, 466
doi: 10.1016/j.apsusc.2018.10.040
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
Barium Titanate and Ni-based multilayer ceramic capacitors have wide commercial applicability, and interfaces are critical to the overall device behavior as they can help control unwanted leakage currents. Here we make use of photoemission methods to investigate the electrostatic barriers formed at BaTiO3/Ni(O) interfaces to understand the implications for electron injection. We find the interface Fermi level in BaTiO3 to evolve smoothly during Ni deposition with a Schottky barrier height for electrons of 0.68 eV, whereas with NiO the Fermi level evolves rapidly with an electron injection barrier of 1.49 eV. In-situ poling shows the Schottky barrier at the BaTiO3/Ni interface is not significantly altered by ferroelectric polarization, consistent with the good screening of the Ni electrode. This study presents a direct quantitative measurement of the interface barrier heights and highlights the significance of the oxidation state of the electrode.
Typ des Eintrags: | Artikel |
---|---|
Erschienen: | 2019 |
Autor(en): | Long, Daniel M. ; Klein, Andreas ; Dickey, Elizabeth C. |
Art des Eintrags: | Bibliographie |
Titel: | Barrier formation at BaTiO3 interfaces with Ni and NiO |
Sprache: | Englisch |
Publikationsjahr: | 1 Februar 2019 |
Verlag: | Elsevier Science Publishing |
Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Surface Science |
Jahrgang/Volume einer Zeitschrift: | 466 |
DOI: | 10.1016/j.apsusc.2018.10.040 |
URL / URN: | https://doi.org/10.1016/j.apsusc.2018.10.040 |
Kurzbeschreibung (Abstract): | Barium Titanate and Ni-based multilayer ceramic capacitors have wide commercial applicability, and interfaces are critical to the overall device behavior as they can help control unwanted leakage currents. Here we make use of photoemission methods to investigate the electrostatic barriers formed at BaTiO3/Ni(O) interfaces to understand the implications for electron injection. We find the interface Fermi level in BaTiO3 to evolve smoothly during Ni deposition with a Schottky barrier height for electrons of 0.68 eV, whereas with NiO the Fermi level evolves rapidly with an electron injection barrier of 1.49 eV. In-situ poling shows the Schottky barrier at the BaTiO3/Ni interface is not significantly altered by ferroelectric polarization, consistent with the good screening of the Ni electrode. This study presents a direct quantitative measurement of the interface barrier heights and highlights the significance of the oxidation state of the electrode. |
Freie Schlagworte: | Barium titanate, Nickel, Nickel oxide, Schottky barrier, Interface, XPS |
Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Elektronenstruktur von Materialien 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Oberflächenforschung |
Hinterlegungsdatum: | 12 Okt 2018 11:24 |
Letzte Änderung: | 09 Apr 2019 07:16 |
PPN: | |
Sponsoren: | This work was supported by the Air Force Office of Scientific Research under grants FA9550-14-1-0067 and FA9550-14-1-0158. |
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