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Ebert, Martin and Mair, V. and Tessadri, R. and Hoffmann, P. and Ortner, H. M. (2000):
Total-reflection X-ray fluorescence analysis of geological microsamples.
55, In: Spectrochimica Acta Part B: Atomic Spectroscopy, (3), pp. 205-212, [Online-Edition: http://www.sciencedirect.com/science/article/B6THN-3YXB2KN-1...],
[Article]

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