Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüßler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüssler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability, 37 (10-11), pp. 1691-1694. Elsevier, ISSN 1872-941X,
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Vogt, Alexander ; Brandt, ; Pena, ; Aller, ; Hartnagel, (1996):
Wachstum und Zuverlässigkeit von resonanten Tunneldioden.
In: Molecular Beam Epitaxy Workshop <1996, Frankfurt/Oder>: Proceedings, [Conference or Workshop Item]