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Number of items: 9.

Mseddi, Souhir and Donner, Wolfgang and Klein, Andreas and Njeh, Anouar (2018):
Residual stress effect on coupling electromechanical factor of epitaxial Barium Strontium Titanate (BST) thin films.
87, In: Mechanics Research Communications, pp. 13-20, ISSN 00936413, DOI: 10.1016/j.mechrescom.2017.12.001,
[Online-Edition: https://doi.org/10.1016/j.mechrescom.2017.12.001],
[Article]

Chaabani, Anouar and Njeh, Anouar and Donner, Wolfgang and Klein, Andreas and Ben Ghozlen, Mohamed Hédi (2017):
Elasticity study of textured barium strontium titanate thin films by X-ray diffraction and laser acoustic waves.
56, In: Japanese Journal of Applied Physics, (5), IOP Publishing, pp. 055501, ISSN 0021-4922, DOI: 10.7567/JJAP.56.055501,
[Online-Edition: https://doi.org/10.7567/JJAP.56.055501],
[Article]

Kamel, Marwa and Mseddi, Souhir and Njeh, Anouar and Donner, Wolfgang and Ben Ghozlen, Mohamed Hédi (2015):
Acoustoelastic effect of textured (Ba,Sr)TiO3 thin films under an initial mechanical stress.
118, In: Journal of Applied Physics, (22), American Institute of Physics, p. 225305, ISSN 0021-8979, [Online-Edition: https://doi.org/10.1063/1.4936784],
[Article]

Wali, Y. and Njeh, Anouar and Wieder, Thomas and Ben Ghozlen, M. H. (2007):
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
40, In: NDT and E International, (7), ELSEVIER, pp. 545-551, ISSN 0963-8695, [Online-Edition: http://dx.doi.org/10.1016/j.ndteint.2007.02.004],
[Article]

Njeh, Anouar and Wieder, Thomas and Ben Ghozlen, M. H. and Fuess, Hartmut (2004):
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
52, In: Materials characterization, pp. 135-143, [Article]

Njeh, Anouar (2002):
Caractéristiques structurales et élastiques des couches minces Ag/Si et Cu/Si.
Sfax, Tun., Univ., TU Darmstadt, [Ph.D. Thesis]

Njeh, Anouar and Wieder, Thomas and Fuess, Hartmut (2002):
Reflectometry studies of the oxidation kinetics of thin copper films.
33, In: Surface and interface analysis, pp. 626-628, [Article]

Njeh, Anouar and Wieder, Thomas and Schneider, D. and Fuess, Hartmut and Ben Ghozlen, M. H. (2002):
Surface wave propagation in thin silver films under residual stress.
57, In: Zeitschrift für Naturforschung / A, pp. 58-64, [Article]

Njeh, Anouar and Wieder, Thomas and Fuess, H. (2000):
Grazing evidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films.
15, In: Powder diffraction, pp. 211-216, [Article]

This list was generated on Tue Dec 10 01:10:11 2019 CET.