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Marathe, Vaibhav G. and Stefanov, Yordan and Schwalke, Udo and DasGupta, Nandita (2006):
Study of Pinholes in Ultrathin SiO2 by C-AFM Technique.
In: Thin Solid Films, pp. 11-14, 504, (1-2), [Online-Edition: http://dx.doi.org/10.1016/j.tsf.2005.09.019],
[Article]

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