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Manca, J. and Croes, K. and DeCeunink, W. and DeSchepper, L. and Dieval, B. and Hartnagel, H. L. (2000):
High temperature time dependent dielectric breakdown of power MOSFET's.
In: The circuit breaker, [Other]

This list was generated on Sat Aug 24 01:31:31 2019 CEST.