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Weinbruch, Stephan and Möller, A. and Stadermann, F. J. (1995):
Determination of the thickness of nm layers by electron probe microanalysis.
Stuttgart, Schweizerbart, In: Mineralogie 1995: Gemeinschaftstagung der Soc. Francaise de Mineralog. et de Christallograph., der Dt. Mineralog. Ges. u. der Österr. Mineralog. Ges. <73, 1995, Straßburg>: Referate. Red.: W.V. Maresch. S. 236. - Stuttgart: Schweizerbart, 1995, Vol7,N, [Conference or Workshop Item]

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