Brandt, Michael ; Krozer, ; Schüßler, ; Bock, ; Hartnagel, (1996)
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894
Article

Schuessler, M. ; Statzner, ; Lin, ; Krozer, ; Horn, ; Hartnagel, Hans L. (1996)
Electrochemical deposition of Pd, Ti, and Ge for applications in GaAs technology.
In: Journal of the Electrochemical Society. 143 (1996), No. 4, S. 73-75
Article

Dehé, Alfons ; Klingbeil, ; Krozer, ; Fricke, ; Beilenhoff, ; Hartnagel, (1996)
GaAs integrated thermoelectric microwave power sensor.
Conference or Workshop Item

Dehé, Alfons ; Klingbeil, ; Krozer, ; Fricke, ; Beilenhoff, ; Hartnagel, (1996)
GaAs monolithic integrated microwave power sensor in coplanar waveguide technology.
Conference or Workshop Item

Dehé, Alfons ; Krozer, ; Chen, ; Hartnagel, (1996)
High-sensitivity microwave power sensor for GaAs-MMIC implementation.
In: Electronic letters. 32 (1996), No. 23, S. 2149-2150
Article

Schuessler, M. ; Krozer, ; Bock, ; Brandt, ; Vecchi, ; Losi, ; Hartnagel, Hans L. (1996)
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910
Article

Pantoja, J. M. M. ; Grüb, Andreas ; Krozer, ; Franco, (1995)
Accuracy of nonoscillating one-port noise measurements.
In: IEEE Transactions on instrumentation and measurement. 44 (1995), No. 4, S. 853-859
Article

Schuessler, M. ; Krozer, ; Pfeiffer, ; Statzner, ; Lee, ; Hartnagel, Hans L. (1995)
AlGaAs/GaAs and GaInP/GaAs HBT for high temperature microwave operation.
Conference or Workshop Item

Grüb, Andreas ; Simon, ; Krozer, ; Lin, ; Shaalan, ; Beilenhoff, ; Sigurdardottir, A. ; Hartnagel, H. L. (1995)
Terahertz research at TH Darmstadt.
Conference or Workshop Item

Fricke, Klaus ; Krozer, ; Hartnagel, (1995)
Theromdynamics of microwave devices.
In: Handbook of microwave technology. Hrsg.: T. Koryu Ishii. Vol. 2. Kap. 36, Edition: Orlando: Academic Press 1995
Book Section